An Algorithmic Test Generation Method for Crosstalk Faults in Synchronous Sequential Circuits

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Sixth Asian Test Symposium (ATS'97)

Akita, JAPAN

November 17-November 18

ISBN: 0-8186-8209-4

	ASCII Text	x
	Noroyoshi Itazaki, Yasutaka Idomoto, Kozo Kinoshita, "An Algorithmic Test Generation Method for Crosstalk Faults in Synchronous Sequential Circuits," Asian Test Symposium, pp. 22, Sixth Asian Test Symposium (ATS'97), 1997.

	BibTex	x
	@article{ 10.1109/ATS.1997.643909, author = {Noroyoshi Itazaki and Yasutaka Idomoto and Kozo Kinoshita}, title = {An Algorithmic Test Generation Method for Crosstalk Faults in Synchronous Sequential Circuits}, journal ={Asian Test Symposium}, volume = {0}, year = {1997}, issn = {1081-7735}, pages = {22}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1997.643909}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Asian Test Symposium TI - An Algorithmic Test Generation Method for Crosstalk Faults in Synchronous Sequential Circuits SN - 1081-7735 SP EP A1 - Noroyoshi Itazaki, A1 - Yasutaka Idomoto, A1 - Kozo Kinoshita, PY - 1997 KW - Crosstalk fault KW - test generation KW - synchronous sequential circuit VL - 0 JA - Asian Test Symposium ER -

Noroyoshi Itazaki, Applied Physics, Osaka Univ.

Yasutaka Idomoto, Applied Physics, Osaka Univ.

Kozo Kinoshita, Applied Physics, Osaka Univ.

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ATS.1997.643909

As VLSI circuits become high-speed and high-density, a crosstalk fault becomes an important problem. In a synchronous sequential circuit, since the crosstalk fault between a data line and a clock line is important, we described an algorithmic test generation technique for the fault. Some simulation results of our method for the ISCAS bench mark circuits are reported.

Index Terms:

Crosstalk fault, test generation, synchronous sequential circuit

Citation:

Noroyoshi Itazaki, Yasutaka Idomoto, Kozo Kinoshita, "An Algorithmic Test Generation Method for Crosstalk Faults in Synchronous Sequential Circuits," ats, pp.22, Sixth Asian Test Symposium (ATS'97), 1997

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