In this paper, we discuss the design of a fail-safe cellular array composed of switch cells. First, we show the design method using a binary decision diagram. Next, we assume stuck-at faults of switch cells to be fault models and discuss the fail-safe property for our array. For all the single faults and part of the multiple faults, our array keeps the fail-safe property. Next, for our arrays realizing randomly generated functions, we derive the ratio of the number of double faults that never break the fail-safe property to the total number of double faults. Finally, in order to demonstrate the advantages of our array, we compare our array with other arrays.