Efficient Path Delay Fault Test Generation Algorithms for Weighted Random Robust Testing
Hsinchu, TAIWAN
November 20-November 22
ISBN: 0-8186-7478-4
ASCII Text
x
Y-M. Hur, J-H. Shin, K-H. Lee, Y-S. Son, I-C. Lim, Y-H. Kim,
"Efficient Path Delay Fault Test Generation Algorithms for Weighted Random Robust Testing,"
Asian Test Symposium, pp. 42, Fifth Asian Test Symposium (ATS'96), 1996.
BibTex
x
@article{
10.1109/ATS.1996.10002, author = {Y-M. Hur and J-H. Shin and K-H. Lee and Y-S. Son and I-C. Lim and Y-H. Kim}, title = {Efficient Path Delay Fault Test Generation Algorithms for Weighted Random Robust Testing}, journal ={Asian Test Symposium}, volume = {0}, year = {1996}, issn = {1081-7735}, pages = {42}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1996.10002}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
x
TY - CONF JO - Asian Test Symposium TI - Efficient Path Delay Fault Test Generation Algorithms for Weighted Random Robust Testing SN - 1081-7735 SP EP A1 - Y-M. Hur, A1 - J-H. Shin, A1 - K-H. Lee, A1 - Y-S. Son, A1 - I-C. Lim, A1 - Y-H. Kim, PY - 1996 VL - 0 JA - Asian Test Symposium ER -
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb