Hierarchical Test Generation with Built-In Fault Diagnosis

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	Similar Articles Articles by Dirk Stroobandt Articles by Jan Van Campenhout

Fifth Asian Test Symposium (ATS'96)

Hsinchu, TAIWAN

November 20-November 22

ISBN: 0-8186-7478-4

	ASCII Text	x
	Dirk Stroobandt, Jan Van Campenhout, "Hierarchical Test Generation with Built-In Fault Diagnosis," Asian Test Symposium, pp. 22, Fifth Asian Test Symposium (ATS'96), 1996.

	BibTex	x
	@article{ 10.1109/ATS.1996.555130, author = {Dirk Stroobandt and Jan Van Campenhout}, title = {Hierarchical Test Generation with Built-In Fault Diagnosis}, journal ={Asian Test Symposium}, volume = {0}, year = {1996}, issn = {1081-7735}, pages = {22}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1996.555130}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Asian Test Symposium TI - Hierarchical Test Generation with Built-In Fault Diagnosis SN - 1081-7735 SP EP A1 - Dirk Stroobandt, A1 - Jan Van Campenhout, PY - 1996 KW - Hierarchical Test Pattern Generation KW - Fault Diagnosis KW - Test Compaction. VL - 0 JA - Asian Test Symposium ER -

Dirk Stroobandt, University of Ghent

Jan Van Campenhout, University of Ghent

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ATS.1996.555130

A hierarchical test generation method is presented that uses the inherent hierarchical structure of the circuit under test and takes fault diagnosability into account right from the start. An efficient test compaction method leads to a very compact test set, while retaining a maximum of diagnostic power and a 100% fault coverage for non-fanout circuits. An extension for fanout circuits is also presented.

Index Terms:

Hierarchical Test Pattern Generation, Fault Diagnosis, Test Compaction.

Citation:

Dirk Stroobandt, Jan Van Campenhout, "Hierarchical Test Generation with Built-In Fault Diagnosis," ats, pp.22, Fifth Asian Test Symposium (ATS'96), 1996

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