Totally Self Checking reconfigurable duplication system with separate internal fault indication

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Fourth Asian Test Symposium (ATS'95)

Bangalore, India

November 23-November 24

ISBN: 0-8186-7129-7

	ASCII Text	x
	N. Gaitanis, P. Kostarakis, A. Paschalis, "Totally Self Checking reconfigurable duplication system with separate internal fault indication," Asian Test Symposium, pp. 316, Fourth Asian Test Symposium (ATS'95), 1995.

	BibTex	x
	@article{ 10.1109/ATS.1995.485354, author = {N. Gaitanis and P. Kostarakis and A. Paschalis}, title = {Totally Self Checking reconfigurable duplication system with separate internal fault indication}, journal ={Asian Test Symposium}, volume = {0}, year = {1995}, isbn = {0-8186-7129-7}, pages = {316}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1995.485354}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Asian Test Symposium TI - Totally Self Checking reconfigurable duplication system with separate internal fault indication SN - 0-8186-7129-7 SP EP A1 - N. Gaitanis, A1 - P. Kostarakis, A1 - A. Paschalis, PY - 1995 KW - redundancy; switching circuits; reconfigurable architectures; decision circuits; fault diagnosis; logic testing; built-in self test; totally self checking system; reconfigurable duplication system; separate internal fault indication; single cell fault model; functional self checking units; error indication; decision circuit; indication outputs; nonstop repair; redundancy VL - 0 JA - Asian Test Symposium ER -

N. Gaitanis, Inst. of Inf. & Telecommun., Athens, Greece

P. Kostarakis, Inst. of Inf. & Telecommun., Athens, Greece

A. Paschalis, Inst. of Inf. & Telecommun., Athens, Greece

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ATS.1995.485354

A Totally Self Checking (TSC) reconfigurable duplication system with respect to single cell fault model is described in this paper. It consists of two identical functional self checking units that receive the same inputs. TSC checkers are associated with each functional unit and produce either a normal indication when the output is correct or an error indication when the output is incorrect. The circuit that receives the indications of the two TSC checkers is a TSC decision circuit that produces two indication outputs E and F, respectively. E indicates mainly the status of the outputs of units while F indicates the existence of internal faults in the TSC decision circuit. Such indications can be used for the non stop repair before redundancy is exhausted. Thus continuous operation is preserved increasing the availability and the reliability of the system.

Index Terms:

redundancy; switching circuits; reconfigurable architectures; decision circuits; fault diagnosis; logic testing; built-in self test; totally self checking system; reconfigurable duplication system; separate internal fault indication; single cell fault model; functional self checking units; error indication; decision circuit; indication outputs; nonstop repair; redundancy

Citation:

N. Gaitanis, P. Kostarakis, A. Paschalis, "Totally Self Checking reconfigurable duplication system with separate internal fault indication," ats, pp.316, Fourth Asian Test Symposium (ATS'95), 1995

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