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Fourth Asian Test Symposium (ATS'95)
Error masking in compact testing based on the Hamming code and its modifications
Bangalore, India
November 23-November 24
ISBN: 0-8186-7129-7
ASCII Text
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S. Demidenko, A. Ivanyukovich, L. Makhist, V. Piuri, "Error masking in compact testing based on the Hamming code and its modifications," Asian Test Symposium, pp. 303, Fourth Asian Test Symposium (ATS'95), 1995.
 
 
BibTex
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@article{ 10.1109/ATS.1995.485352,
author = {S. Demidenko and A. Ivanyukovich and L. Makhist and V. Piuri},
title = {Error masking in compact testing based on the Hamming code and its modifications},
journal ={Asian Test Symposium},
volume = {0},
year = {1995},
isbn = {0-8186-7129-7},
pages = {303},
doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1995.485352},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Asian Test Symposium
TI - Error masking in compact testing based on the Hamming code and its modifications
SN - 0-8186-7129-7
SP
EP
A1 - S. Demidenko,
A1 - A. Ivanyukovich,
A1 - L. Makhist,
A1 - V. Piuri,
PY - 1995
KW - Hamming codes; binary sequences; logic testing; probability; error masking; compact testing; Hamming code; invalid sequence; probability distribution; signature analysis; code words; arbitrary weight; masking probability
VL - 0
JA - Asian Test Symposium
ER -
 
S. Demidenko, Singapore Polytech., Singapore
A. Ivanyukovich, Singapore Polytech., Singapore
L. Makhist, Singapore Polytech., Singapore
V. Piuri, Singapore Polytech., Singapore
Probability that an invalid sequence at an output of a device under test is not detected (error masking) is the measure of the effectiveness of compact testing methods. This paper evaluates and analyses the probability distribution of error masking for compact testing by exploiting the characteristics both of the Hamming code (i.e., the signature analysis) and of some modified Hamming codes. To study the effectiveness of these methods we derive also the analytical expressions for the number of code words of arbitrary weight. Finally, bounds for error masking probability are obtained.
Index Terms:
Hamming codes; binary sequences; logic testing; probability; error masking; compact testing; Hamming code; invalid sequence; probability distribution; signature analysis; code words; arbitrary weight; masking probability
Citation:
S. Demidenko, A. Ivanyukovich, L. Makhist, V. Piuri, "Error masking in compact testing based on the Hamming code and its modifications," ats, pp.303, Fourth Asian Test Symposium (ATS'95), 1995
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