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Fourth Asian Test Symposium (ATS'95)
Fast computation of C-MISR signatures
Bangalore, India
November 23-November 24
ISBN: 0-8186-7129-7
M. Franklin, Dept. of Electr. & Comput. Eng., Clemson Univ., SC, USA
Cellular automata based signature analyzers are becoming very popular for compressing test responses in built-in self-test applications. Off-line determination of signatures (both good circuit signature and faulty circuit signatures) is a compute-intensive process that involves cycle-by-cycle simulation of the signature analyzer. In this paper, we investigate a technique for speeding up the simulation of cellular automata-based multi-input signature registers (C-MISRs). First, we describe a technique for converting a C-MISR into an equivalent single input circuit. We then present an algorithm for parallelizing the simulation of these single input circuits.
Index Terms:
cellular automata; shift registers; logic testing; sequential circuits; built-in self test; equivalent circuits; VLSI; integrated circuit testing; C-MISR signatures; signature analyzers; test responses; built-in self-test applications; good circuit signature; faulty circuit signatures; cellular automata-based multi-input signature registers; equivalent single input circuit
Citation:
M. Franklin, "Fast computation of C-MISR signatures," ats, pp.293, Fourth Asian Test Symposium (ATS'95), 1995
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