On the development of power supply voltage control testing technique for analogue circuits

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Fourth Asian Test Symposium (ATS'95)

Bangalore, India

November 23-November 24

ISBN: 0-8186-7129-7

	ASCII Text	x
	A.K.B. A'ain, A.H. Bratt, A.P. Dorey, "On the development of power supply voltage control testing technique for analogue circuits," Asian Test Symposium, pp. 133, Fourth Asian Test Symposium (ATS'95), 1995.

	BibTex	x
	@article{ 10.1109/ATS.1995.485328, author = {A.K.B. A'ain and A.H. Bratt and A.P. Dorey}, title = {On the development of power supply voltage control testing technique for analogue circuits}, journal ={Asian Test Symposium}, volume = {0}, year = {1995}, isbn = {0-8186-7129-7}, pages = {133}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1995.485328}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Asian Test Symposium TI - On the development of power supply voltage control testing technique for analogue circuits SN - 0-8186-7129-7 SP EP A1 - A.K.B. A'ain, A1 - A.H. Bratt, A1 - A.P. Dorey, PY - 1995 KW - fault diagnosis; power supply circuits; voltage control; integrated circuit testing; analogue integrated circuits; circuit analysis computing; data analysis; operational amplifiers; power supply voltage control testing; analogue circuits; operational amplifier; simulation; IC tests; data analysis; hard defects; soft defects VL - 0 JA - Asian Test Symposium ER -

A.K.B. A'ain, Microelectron. Res. Group, Lancaster Univ., UK

A.H. Bratt, Microelectron. Res. Group, Lancaster Univ., UK

A.P. Dorey, Microelectron. Res. Group, Lancaster Univ., UK

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ATS.1995.485328

This paper discusses a novel testing technique for analogue circuits. The theory behind its success in exposing defects normally unexposed by other testing techniques is presented. This is supported by simulation results and real IC tests. Due to its modest requirement to perform the test, this testing scheme is more attractive and beneficial. Methods of data analysis are also proposed to expose hard and soft defects. The advantages of the proposed testing scheme are fast to implement, uses simple test vector and does not require additional test circuitry on-chip.

Index Terms:

fault diagnosis; power supply circuits; voltage control; integrated circuit testing; analogue integrated circuits; circuit analysis computing; data analysis; operational amplifiers; power supply voltage control testing; analogue circuits; operational amplifier; simulation; IC tests; data analysis; hard defects; soft defects

Citation:

A.K.B. A'ain, A.H. Bratt, A.P. Dorey, "On the development of power supply voltage control testing technique for analogue circuits," ats, pp.133, Fourth Asian Test Symposium (ATS'95), 1995

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