Enhancing multiple fault diagnosis in combinational circuits based on sensitized paths and EB testing

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Fourth Asian Test Symposium (ATS'95)

Bangalore, India

November 23-November 24

ISBN: 0-8186-7129-7

	ASCII Text	x
	H. Takahashi, N. Yanagida, Y. Takamatsu, "Enhancing multiple fault diagnosis in combinational circuits based on sensitized paths and EB testing," Asian Test Symposium, pp. 58, Fourth Asian Test Symposium (ATS'95), 1995.

	BibTex	x
	@article{ 10.1109/ATS.1995.485317, author = {H. Takahashi and N. Yanagida and Y. Takamatsu}, title = {Enhancing multiple fault diagnosis in combinational circuits based on sensitized paths and EB testing}, journal ={Asian Test Symposium}, volume = {0}, year = {1995}, isbn = {0-8186-7129-7}, pages = {58}, doi = {http://doi.ieeecomputersociety.org/10.1109/ATS.1995.485317}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Asian Test Symposium TI - Enhancing multiple fault diagnosis in combinational circuits based on sensitized paths and EB testing SN - 0-8186-7129-7 SP EP A1 - H. Takahashi, A1 - N. Yanagida, A1 - Y. Takamatsu, PY - 1995 KW - combinational circuits; fault diagnosis; logic testing; fault location; electron beam testing; VLSI; multiple fault diagnosis; combinational circuits; sensitized paths; EB testing; TP-1; TP-2; TP-3; TP-4; electron-beam tester; fault location; stuck-at faults; internal lines; diagnostic resolution VL - 0 JA - Asian Test Symposium ER -

H. Takahashi, Dept. of Comput. Sci., Ehime Univ., Matsuyama, Japan

N. Yanagida, Dept. of Comput. Sci., Ehime Univ., Matsuyama, Japan

Y. Takamatsu, Dept. of Comput. Sci., Ehime Univ., Matsuyama, Japan

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ATS.1995.485317

In this paper, we improve the previous method by enhancing a set of diagnostic tests and using an EB testing method. We first enhance the previous set of diagnostic tests to one of diagnostic tests consisting of the four sets, TP-1, TP-2, TP-3 and TP-4. We next present two diagnostic methods by using the enhanced diagnostic tests and an electron-beam tester (EB-tester). Experimental results show that the presented method identified fault locations within 0.2 to 5% of all stuck-at faults on all lines in the circuit by probing about 0.8 to 15% internal lines.

Index Terms:

combinational circuits; fault diagnosis; logic testing; fault location; electron beam testing; VLSI; multiple fault diagnosis; combinational circuits; sensitized paths; EB testing; TP-1; TP-2; TP-3; TP-4; electron-beam tester; fault location; stuck-at faults; internal lines; diagnostic resolution

Citation:

H. Takahashi, N. Yanagida, Y. Takamatsu, "Enhancing multiple fault diagnosis in combinational circuits based on sensitized paths and EB testing," ats, pp.58, Fourth Asian Test Symposium (ATS'95), 1995

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