Fourth Asian Test Symposium (ATS'95)
A cellular array designed from a Multiple-valued Decision Diagram and its fault tests
Bangalore, India
November 23-November 24
ISBN: 0-8186-7129-7
N. Kamiura, Fac. of Eng., Himeji Inst. of Technol., Japan
Y. Hata, Fac. of Eng., Himeji Inst. of Technol., Japan
K. Yamato, Fac. of Eng., Himeji Inst. of Technol., Japan
In this paper, we discuss easily testable cellular arrays that are constructed from Multiple-valued Decision Diagrams (MDD's). The cellular arrays consist of cells having simple switch functions. Since control inputs that specify switches of cells are determined easily by tracing paths activated in MDD's, our method for constructing cellular arrays is simple. We propose fault tests for multiple stuck-at faults of switch cells. We can locate any row having at least one faulty cell. We apply our array to the realizations of numerous binary and multiple-valued logic functions and compare our array with other cellular arrays.
Index Terms:
cellular arrays; fault diagnosis; logic testing; multivalued logic circuits; VLSI; logic CAD; cellular array; multiple-valued decision diagram; fault tests; testable cellular arrays; switch functions; multiple stuck-at faults
Citation:
N. Kamiura, Y. Hata, K. Yamato, "A cellular array designed from a Multiple-valued Decision Diagram and its fault tests," ats, pp.20, Fourth Asian Test Symposium (ATS'95), 1995
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