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Asia and South Pacific Design Automation Conference 1999 (ASP-DAC'99)
On the Testing Quality of Random and Pseudo-random Sequences for Permanent and Intermittent Faults
Wanchai, Hong Kong
January 18-January 21
ISBN: 0-7803-5012-X
Jin Ding, Beijing Univ. of Posts & Telecom., China
Yu-Liang Wu, The Chinese University of Hong Kong, Shatin
In this paper, the natures of random and pseudo-random input sequences and their influence on permanent and intermittent fault detecting are analyzed. The aliasing fault coverage between the pseudo-random and random sequences is estimated. The activity probability features of the intermittent faults are considered. The self-test circuits of the intermittent faults are illustrated. The experimental results based on real circuits are obtained through simulation. The mathematical analysis and experimental results show that the quality of the pseudo-random testing is better than that of the random testing for the permanent and intermittent faults. The Markov chain models are used in obtaining the input sequence length needed for determining if a circuit fault is intermittent or permanent.
Citation:
Jin Ding, Yu-Liang Wu, "On the Testing Quality of Random and Pseudo-random Sequences for Permanent and Intermittent Faults," asp-dac, pp.311, Asia and South Pacific Design Automation Conference 1999 (ASP-DAC'99), 1999
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