loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
Asia and South Pacific Design Automation Conference 1999 (ASP-DAC'99)
Diagnosing Single Faults for Interconnects in SRAM Based FPGAs
Wanchai, Hong Kong
January 18-January 21
ISBN: 0-7803-5012-X
Yinlei Yu, Fudan University, Shanghai, China
Jian Xu, Fudan University, Shanghai, China
Wei Kang Huang, Fudan University, Shanghai, China
Fabrizio Lombardi, Northeastern University, Boston, MA
This paper presents a method to diagnose faults in FPGA interconnection resources. A single fault model is given. Under the given model, a diagnosing method is proposed. At most five programming steps in the proposed method is required if adaptive testing scheme is used. For non-adaptive test, eight programming steps is required to diagnose all the possible faults under the given single fault model. The accuracy of the fault diagnosing is one segment for a segment stuck-at or stuck-open fault, a segment pair for a bridge fault, a switch for switch stuck-on or stuck-off fault.
Index Terms:
FPGA, testing, fault model, fault diagnosis
Citation:
Yinlei Yu, Jian Xu, Wei Kang Huang, Fabrizio Lombardi, "Diagnosing Single Faults for Interconnects in SRAM Based FPGAs," asp-dac, pp.283, Asia and South Pacific Design Automation Conference 1999 (ASP-DAC'99), 1999
Usage of this product signifies your acceptance of the Terms of Use.