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19th IEEE International Conference on Automated Software Engineering (ASE'04)
A Statistical Model to Locate Faults at Input Level
Linz, Austria
September 20-September 24
ISBN: 0-7695-2131-2
Wu Ji, Beijing University of Aeronautics and Astronautics, Beijing, China
Jia Xiao-xia, Beijing University of Aeronautics and Astronautics, Beijing, China
Liu Chang, Beijing University of Aeronautics and Astronautics, Beijing, China
Yang Hai-yan, Beijing University of Aeronautics and Astronautics, Beijing, China
Liu Chao, Beijing University of Aeronautics and Astronautics, Beijing, China
Jin Mao-zhong, Beijing University of Aeronautics and Astronautics, Beijing, China
We present a statistical model to locate faults at the input level based on the failure patterns and the success patterns. The model neither needs to be fed with software module, code or trace information, nor does it require re-executing the program. To evaluate the model, precision and recall are adopted as the criteria. Five programs are examined and 17 testing experiments are conducted in which the model gains 0.803 in precision and 0.697 in recall on average.
Citation:
Wu Ji, Jia Xiao-xia, Liu Chang, Yang Hai-yan, Liu Chao, Jin Mao-zhong, "A Statistical Model to Locate Faults at Input Level," ase, pp.274-277, 19th IEEE International Conference on Automated Software Engineering (ASE'04), 2004
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