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Seventh Asia-Pacific Software Engineering Conference (APSEC'00)
Tailoring test process by using the component-based development paradigm and the XML technology
Singapore
December 05-December 08
ISBN: 0-7695-0915-0
ASCII Text
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Jooyoung Seo, Byoungju Choi, "Tailoring test process by using the component-based development paradigm and the XML technology," Asia-Pacific Software Engineering Conference, pp. 356, Seventh Asia-Pacific Software Engineering Conference (APSEC'00), 2000.
 
 
BibTex
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@article{ 10.1109/APSEC.2000.896720,
author = {Jooyoung Seo and Byoungju Choi},
title = {Tailoring test process by using the component-based development paradigm and the XML technology},
journal ={Asia-Pacific Software Engineering Conference},
volume = {0},
year = {2000},
issn = {1530-1362},
pages = {356},
doi = {http://doi.ieeecomputersociety.org/10.1109/APSEC.2000.896720},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Asia-Pacific Software Engineering Conference
TI - Tailoring test process by using the component-based development paradigm and the XML technology
SN - 1530-1362
SP
EP
A1 - Jooyoung Seo,
A1 - Byoungju Choi,
PY - 2000
KW - program testing; software process improvement; software standards; subroutines; ISO standards; IEC standards; hypermedia markup languages; software tools; computer aided software engineering; software test process customization; component-based development paradigm; XML technology; ISO; IEC; software products; software processes; project-specific standards; test process meta-model; process tailoring scheme; component-based development customization technique; AutoTP; automation tool; Rational Objectory process; Extensible Markup Language
VL - 0
JA - Asia-Pacific Software Engineering Conference
ER -
 
Jooyoung Seo, Dept. of Comput. Sci. & Eng., Ewha Woman's Univ., Seoul, South Korea
Byoungju Choi, Dept. of Comput. Sci. & Eng., Ewha Woman's Univ., Seoul, South Korea
ISO (International Standardization Organization) and the IEC (International Electrotechnical Commission) provide numerous standards for software products and processes. Utilizing those standards specific to a project requires some tailoring to meet the development domain. This paper includes: (1) a test process meta-model, which is a test process defined in standards; (2) "a scheme for tailoring processes" following a component-based development customization technique; and (3) AutoTP, an "automation tool for tailoring", which is derived from XML techniques. AutoTP is a tool in which a standard test process automatically generates a tailored test process by means of a methodology and a domain. In addition, the Rational Objectory process is used as an empirical study in this paper.
Index Terms:
program testing; software process improvement; software standards; subroutines; ISO standards; IEC standards; hypermedia markup languages; software tools; computer aided software engineering; software test process customization; component-based development paradigm; XML technology; ISO; IEC; software products; software processes; project-specific standards; test process meta-model; process tailoring scheme; component-based development customization technique; AutoTP; automation tool; Rational Objectory process; Extensible Markup Language
Citation:
Jooyoung Seo, Byoungju Choi, "Tailoring test process by using the component-based development paradigm and the XML technology," apsec, pp.356, Seventh Asia-Pacific Software Engineering Conference (APSEC'00), 2000
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