Guided Model Checking with a Bayesian Meta-heuristic

	This Article
	Subscribers, please Login Purchase article: $19 PDF IEEE Xplore Subscribers RSS feed
	Share
	Email this Article to a friend
	Bibliographic References
	ASCII Text BibTex RefWorks Procite/RefMan/Endnote
	Add to:
	Digg Furl Spurl Blink Simpy Google Del.icio.us Y!MyWeb
	Search
	Similar Articles Articles by Kevin Seppi Articles by Michael Jones Articles by Peter Lamborn

Fourth International Conference on Application of Concurrency to System Design (ACSD'04)

Hamilton, Ontario, Canada

June 16-June 18

ISBN: 0-7695-2077-4

	ASCII Text	x
	Kevin Seppi, Michael Jones, Peter Lamborn, "Guided Model Checking with a Bayesian Meta-heuristic," Application of Concurrency to System Design, International Conference on, pp. 217, Fourth International Conference on Application of Concurrency to System Design (ACSD'04), 2004.

	BibTex	x
	@article{ 10.1109/CSD.2004.1309134, author = {Kevin Seppi and Michael Jones and Peter Lamborn}, title = {Guided Model Checking with a Bayesian Meta-heuristic}, journal ={Application of Concurrency to System Design, International Conference on}, volume = {0}, year = {2004}, isbn = {0-7695-2077-4}, pages = {217}, doi = {http://doi.ieeecomputersociety.org/10.1109/CSD.2004.1309134}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - Application of Concurrency to System Design, International Conference on TI - Guided Model Checking with a Bayesian Meta-heuristic SN - 0-7695-2077-4 SP EP A1 - Kevin Seppi, A1 - Michael Jones, A1 - Peter Lamborn, PY - 2004 KW - null VL - 0 JA - Application of Concurrency to System Design, International Conference on ER -

Kevin Seppi, Brigham Young University, Provo UT

Michael Jones, Brigham Young University, Provo UT

Peter Lamborn, Brigham Young University, Provo UT

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/CSD.2004.1309134

This paper presents a formal verification algorithm for finding errors in models of complex concurrent systems. The algorithm improves explicit guided model checking by applying the Empirical Bayes method to revise heuristic estimates of the distance from a given state to an error state. Guided search using the revised estimates finds errors with less search effort than the original estimates.

Citation:

Kevin Seppi, Michael Jones, Peter Lamborn, "Guided Model Checking with a Bayesian Meta-heuristic," acsd, pp.217, Fourth International Conference on Application of Concurrency to System Design (ACSD'04), 2004

Peer Review Notice | Give Us Feedback

Usage of this product signifies your acceptance of the Terms of Use.