Third International Conference on Application of Concurrency to System Design (ACSD'03)
Specification Coverage Aided Test Selection
Guimar?es, Portugal
June 18-June 20
ISBN: 0-7695-1887-7
In this paper test selection strategies in formal conformance testing are considered. As the testing conformance relation we use the ioco relation, and extend the previously presented on-the-fly test generation algorithms for ioco to include test selection heuristic based on a specification coverage metric. The proposed method combines a greedy test selection with randomization to guarantee completeness. As a novel implementation technique we employ bounded model checking for lookahead in greedy test selection.