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Seamless Test of Digital Components in Mixed-Signal Paths
January/February 2004 (vol. 21 no. 1)
pp. 44-55
ASCII Text
x 
 
Sule Ozev, Ismet Bayraktaroglu, Alex Orailoglu, "Seamless Test of Digital Components in Mixed-Signal Paths," IEEE Design and Test of Computers, vol. 21, no. 1, pp. 44-55, January/February, 2004.
 
 
BibTex
x
 
@article{ 10.1109/MDT.2004.1261849,
author = {Sule Ozev and Ismet Bayraktaroglu and Alex Orailoglu},
title = {Seamless Test of Digital Components in Mixed-Signal Paths},
journal ={IEEE Design and Test of Computers},
volume = {21},
number = {1},
issn = {0740-7475},
year = {2004},
pages = {44-55},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2004.1261849},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - Seamless Test of Digital Components in Mixed-Signal Paths
IS - 1
SN - 0740-7475
SP44
EP55
EPD - 44-55
A1 - Sule Ozev,
A1 - Ismet Bayraktaroglu,
A1 - Alex Orailoglu,
PY - 2004
VL - 21
JA - IEEE Design and Test of Computers
ER -
 
Sule Ozev, Duke University
Ismet Bayraktaroglu, Sun Microsystems
Alex Orailoglu, University of California, San Diego

For today's large, mixed-signal designs, test generation requires propagating signals through digital and analog modules. This article offers an innovative seamless approach that defines a digital test methodology for digital modules wherein the test inputs and responses can be propagated through a path containing analog signals.

Citation:
Sule Ozev, Ismet Bayraktaroglu, Alex Orailoglu, "Seamless Test of Digital Components in Mixed-Signal Paths," IEEE Design and Test of Computers, vol. 21, no. 1, pp. 44-55, Jan./Feb. 2004, doi:10.1109/MDT.2004.1261849
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