Efficient and Economical Test Equipment Setup Using Procorrelation

	This Article
	Subscribers, please Login Purchase article: $19 PDF HTML IEEE Xplore Subscribers RSS feed
	Share
	Email this Article to a friend
	Bibliographic References
	ASCII Text BibTex RefWorks Procite/RefMan/Endnote
	Add to:
	Digg Furl Spurl Blink Simpy Google Del.icio.us Y!MyWeb
	Search
	Similar Articles Articles by Bin-Hong Lin Articles by Cheng-Wen Wu Articles by Hwei-Tsu Ann Luh

January/February 2004 (vol. 21 no. 1)

pp. 34-43

	ASCII Text	x
	Bin-Hong Lin, Cheng-Wen Wu, Hwei-Tsu Ann Luh, "Efficient and Economical Test Equipment Setup Using Procorrelation," IEEE Design and Test of Computers, vol. 21, no. 1, pp. 34-43, January/February, 2004.

	BibTex	x
	@article{ 10.1109/MDT.2004.1261848, author = {Bin-Hong Lin and Cheng-Wen Wu and Hwei-Tsu Ann Luh}, title = {Efficient and Economical Test Equipment Setup Using Procorrelation}, journal ={IEEE Design and Test of Computers}, volume = {21}, number = {1}, issn = {0740-7475}, year = {2004}, pages = {34-43}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2004.1261848}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Design and Test of Computers TI - Efficient and Economical Test Equipment Setup Using Procorrelation IS - 1 SN - 0740-7475 SP34 EP43 EPD - 34-43 A1 - Bin-Hong Lin, A1 - Cheng-Wen Wu, A1 - Hwei-Tsu Ann Luh, PY - 2004 VL - 21 JA - IEEE Design and Test of Computers ER -

Bin-Hong Lin, Intellectual Property Library Co.

Cheng-Wen Wu, National Tsing Hua University

Hwei-Tsu Ann Luh, Taiwan Semiconductor Manufacturing Co.

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2004.1261848

The Procorrelation System (PCS) obtains a high-quality correlation between die failures on a premanufactured recorded correlation wafer and the test equipment setup for the current wafer lot. PCS greatly reduces analysis time and test cost, compared with conventional full-wafer probing and offers significant benefits for deep-submicron ICs.

Citation:

Bin-Hong Lin, Cheng-Wen Wu, Hwei-Tsu Ann Luh, "Efficient and Economical Test Equipment Setup Using Procorrelation," IEEE Design and Test of Computers, vol. 21, no. 1, pp. 34-43, Jan./Feb. 2004, doi:10.1109/MDT.2004.1261848

Peer Review Notice | Give Us Feedback

Usage of this product signifies your acceptance of the Terms of Use.