Efficient and Economical Test Equipment Setup Using Procorrelation January/February 2004 (vol. 21 no. 1) pp. 34-43
The Procorrelation System (PCS) obtains a high-quality correlation between die failures on a premanufactured recorded correlation wafer and the test equipment setup for the current wafer lot. PCS greatly reduces analysis time and test cost, compared with conventional full-wafer probing and offers significant benefits for deep-submicron ICs.
Citation:
Bin-Hong Lin, Cheng-Wen Wu, Hwei-Tsu Ann Luh, "Efficient and Economical Test Equipment Setup Using Procorrelation," IEEE Design and Test of Computers, vol. 21, no. 1, pp. 34-43, Jan./Feb. 2004, doi:10.1109/MDT.2004.1261848 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||