An Integrated Environment for Technology Closure of Deep-Submicron IC Designs

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	Similar Articles Articles by Louise Trevillyan Articles by David Kung Articles by Ruchir Puri Articles by Lakshmi N. Reddy Articles by Michael A. Kazda

January/February 2004 (vol. 21 no. 1)

pp. 14-22

	ASCII Text	x
	Louise Trevillyan, David Kung, Ruchir Puri, Lakshmi N. Reddy, Michael A. Kazda, "An Integrated Environment for Technology Closure of Deep-Submicron IC Designs," IEEE Design and Test of Computers, vol. 21, no. 1, pp. 14-22, January/February, 2004.

	BibTex	x
	@article{ 10.1109/MDT.2004.1261846, author = {Louise Trevillyan and David Kung and Ruchir Puri and Lakshmi N. Reddy and Michael A. Kazda}, title = {An Integrated Environment for Technology Closure of Deep-Submicron IC Designs}, journal ={IEEE Design and Test of Computers}, volume = {21}, number = {1}, issn = {0740-7475}, year = {2004}, pages = {14-22}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2004.1261846}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Design and Test of Computers TI - An Integrated Environment for Technology Closure of Deep-Submicron IC Designs IS - 1 SN - 0740-7475 SP14 EP22 EPD - 14-22 A1 - Louise Trevillyan, A1 - David Kung, A1 - Ruchir Puri, A1 - Lakshmi N. Reddy, A1 - Michael A. Kazda, PY - 2004 VL - 21 JA - IEEE Design and Test of Computers ER -

Louise Trevillyan, IBM T.J. Watson Research Center

David Kung, IBM T.J. Watson Research Center

Ruchir Puri, IBM T.J. Watson Research Center

Lakshmi N. Reddy, IBM Microelectronics Division

Michael A. Kazda, IBM Microelectronics Division

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2004.1261846

With larger chip images and increasingly aggressive technologies, key design processes must interoperate. PDS, a physical-synthesis system, accomplishes technology closure through interacting processes of logic optimization, placement, timing, clock insertion, and routing, all using a common infrastructure with robust variable-accuracy analysis abstractions.

Citation:

Louise Trevillyan, David Kung, Ruchir Puri, Lakshmi N. Reddy, Michael A. Kazda, "An Integrated Environment for Technology Closure of Deep-Submicron IC Designs," IEEE Design and Test of Computers, vol. 21, no. 1, pp. 14-22, Jan./Feb. 2004, doi:10.1109/MDT.2004.1261846

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