Obtaining High Defect Coverage for Frequency-Dependent Defects in Complex ASICs

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September/October 2003 (vol. 20 no. 5)

pp. 46-53

	ASCII Text	x
	Robert Madge, Brady R. Benware, W. Robert Daasch, "Obtaining High Defect Coverage for Frequency-Dependent Defects in Complex ASICs," IEEE Design and Test of Computers, vol. 20, no. 5, pp. 46-53, September/October, 2003.

	BibTex	x
	@article{ 10.1109/MDT.2003.1232256, author = {Robert Madge and Brady R. Benware and W. Robert Daasch}, title = {Obtaining High Defect Coverage for Frequency-Dependent Defects in Complex ASICs}, journal ={IEEE Design and Test of Computers}, volume = {20}, number = {5}, issn = {0740-7475}, year = {2003}, pages = {46-53}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2003.1232256}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Design and Test of Computers TI - Obtaining High Defect Coverage for Frequency-Dependent Defects in Complex ASICs IS - 5 SN - 0740-7475 SP46 EP53 EPD - 46-53 A1 - Robert Madge, A1 - Brady R. Benware, A1 - W. Robert Daasch, PY - 2003 VL - 20 JA - IEEE Design and Test of Computers ER -

Robert Madge, LSI Logic

Brady R. Benware, LSI Logic

W. Robert Daasch, Portland State University

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2003.1232256

Editor's note:

Structured delay tests have been around for years, but how effectively do they identify defective silicon, even at reduced frequency? How much overkill is associated with their use? The authors present data from industrial circuits aimed at these and other aspects of speed testing.

—Ken Butler, Texas Instruments

Citation:

Robert Madge, Brady R. Benware, W. Robert Daasch, "Obtaining High Defect Coverage for Frequency-Dependent Defects in Complex ASICs," IEEE Design and Test of Computers, vol. 20, no. 5, pp. 46-53, Sep./Oct. 2003, doi:10.1109/MDT.2003.1232256

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