Speed Binning with Path Delay Test in 150-nm Technology

Design&Test
2003
Issue No. 5 - September/October
Abstract - Speed Binning with Path Delay Test in 150-nm Technology

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September/October 2003 (vol. 20 no. 5)

pp. 41-45

	ASCII Text	x
	Bruce D. Cory, Rohit Kapur, Bill Underwood, "Speed Binning with Path Delay Test in 150-nm Technology," IEEE Design and Test of Computers, vol. 20, no. 5, pp. 41-45, September/October, 2003.

	BibTex	x
	@article{ 10.1109/MDT.2003.1232255, author = {Bruce D. Cory and Rohit Kapur and Bill Underwood}, title = {Speed Binning with Path Delay Test in 150-nm Technology}, journal ={IEEE Design and Test of Computers}, volume = {20}, number = {5}, issn = {0740-7475}, year = {2003}, pages = {41-45}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2003.1232255}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - IEEE Design and Test of Computers TI - Speed Binning with Path Delay Test in 150-nm Technology IS - 5 SN - 0740-7475 SP41 EP45 EPD - 41-45 A1 - Bruce D. Cory, A1 - Rohit Kapur, A1 - Bill Underwood, PY - 2003 VL - 20 JA - IEEE Design and Test of Computers ER -

Bruce D. Cory, nVidia

Rohit Kapur, Synopsys

Bill Underwood, Synopsys

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2003.1232255

Editor's note:

What would it take to reduce speed binning's dependency on functional testing? One answer is a structural at-speed test approach that can achieve the same effectiveness as functional testing. The authors of this article offer a formula to relate structural critical-path testing frequency to system-operation frequency. They demonstrate that there can be a high correlation between frequencies resulting from structural testing and those resulting from functional testing.

—Li-C. Wang, University of California, Santa Barbara

Citation:

Bruce D. Cory, Rohit Kapur, Bill Underwood, "Speed Binning with Path Delay Test in 150-nm Technology," IEEE Design and Test of Computers, vol. 20, no. 5, pp. 41-45, Sep./Oct. 2003, doi:10.1109/MDT.2003.1232255

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