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AC Scan Path Selection for Physical Debugging
September/October 2003 (vol. 20 no. 5)
pp. 34-40
ASCII Text
x 
 
Alfred L. Crouch, John C. Potter, Jason Doege, "AC Scan Path Selection for Physical Debugging," IEEE Design and Test of Computers, vol. 20, no. 5, pp. 34-40, September/October, 2003.
 
 
BibTex
x
 
@article{ 10.1109/MDT.2003.1232254,
author = {Alfred L. Crouch and John C. Potter and Jason Doege},
title = {AC Scan Path Selection for Physical Debugging},
journal ={IEEE Design and Test of Computers},
volume = {20},
number = {5},
issn = {0740-7475},
year = {2003},
pages = {34-40},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2003.1232254},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - AC Scan Path Selection for Physical Debugging
IS - 5
SN - 0740-7475
SP34
EP40
EPD - 34-40
A1 - Alfred L. Crouch,
A1 - John C. Potter,
A1 - Jason Doege,
PY - 2003
VL - 20
JA - IEEE Design and Test of Computers
ER -
 

Editor's note:
Commercial EDA tools support critical-path identification, as well as transition and path delay ATPG. But how can you narrow down the target faults or paths, and which ATPG technique should you use? The authors present a practical methodology addressing these important questions.
—Ken Butler, Texas Instruments

Citation:
Alfred L. Crouch, John C. Potter, Jason Doege, "AC Scan Path Selection for Physical Debugging," IEEE Design and Test of Computers, vol. 20, no. 5, pp. 34-40, Sep./Oct. 2003, doi:10.1109/MDT.2003.1232254
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