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Benefits of a SoC-Specific Test Methodology
May/June 2003 (vol. 20 no. 3)
pp. 68-77
ASCII Text
x 
 
Md. Saffat Quasem, Zhigang Jiang, Sandeep K. Gupta, "Benefits of a SoC-Specific Test Methodology," IEEE Design and Test of Computers, vol. 20, no. 3, pp. 68-77, May/June, 2003.
 
 
BibTex
x
 
@article{ 10.1109/MDT.2003.1198688,
author = {Md. Saffat Quasem and Zhigang Jiang and Sandeep K. Gupta},
title = {Benefits of a SoC-Specific Test Methodology},
journal ={IEEE Design and Test of Computers},
volume = {20},
number = {3},
issn = {0740-7475},
year = {2003},
pages = {68-77},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2003.1198688},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - Benefits of a SoC-Specific Test Methodology
IS - 3
SN - 0740-7475
SP68
EP77
EPD - 68-77
A1 - Md. Saffat Quasem,
A1 - Zhigang Jiang,
A1 - Sandeep K. Gupta,
PY - 2003
VL - 20
JA - IEEE Design and Test of Computers
ER -
 
Md. Saffat Quasem, University of Southern California
Zhigang Jiang, University of Southern California
Sandeep K. Gupta, University of Southern California

Editor?s note:

The tradeoff between IP protection and SoC-level test optimization has been an issue for some time. The more IP providers protect their IP, the less flexibility system developers have to control test costs and fault coverage. Here, a new approach dynamically extracts IP-related test information for optimizing SoC testing without jeopardizing IP protection.
--Yervant Zorian, Virage Logic

Citation:
Md. Saffat Quasem, Zhigang Jiang, Sandeep K. Gupta, "Benefits of a SoC-Specific Test Methodology," IEEE Design and Test of Computers, vol. 20, no. 3, pp. 68-77, May/June 2003, doi:10.1109/MDT.2003.1198688
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