loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
2D Test Sequence Generators
January/February 2003 (vol. 20 no. 1)
pp. 51-59
ASCII Text
x 
 
Grzegorz Mrugalski, Jerzy Tyszer, Janusz Rajski, "2D Test Sequence Generators," IEEE Design and Test of Computers, vol. 20, no. 1, pp. 51-59, January/February, 2003.
 
 
BibTex
x
 
@article{ 10.1109/MDT.2003.1173053,
author = {Grzegorz Mrugalski and Jerzy Tyszer and Janusz Rajski},
title = {2D Test Sequence Generators},
journal ={IEEE Design and Test of Computers},
volume = {20},
number = {1},
issn = {0740-7475},
year = {2003},
pages = {51-59},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2003.1173053},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - 2D Test Sequence Generators
IS - 1
SN - 0740-7475
SP51
EP59
EPD - 51-59
A1 - Grzegorz Mrugalski,
A1 - Jerzy Tyszer,
A1 - Janusz Rajski,
PY - 2003
VL - 20
JA - IEEE Design and Test of Computers
ER -
 
Grzegorz Mrugalski, Poznan University of Technology
Jerzy Tyszer, Poznan University of Technology
Janusz Rajski, Mentor Graphics

In experiments examining test pattern generators using LFSRs with and without phase shifters as sources of 2D stimuli, generators with phase shifters consistently achieved higher hit ratios than those without them. Moreover, a new algorithm synthesizes phase shifters, minimizes linear dependencies, and highly balances the use of generator stages.

Citation:
Grzegorz Mrugalski, Jerzy Tyszer, Janusz Rajski, "2D Test Sequence Generators," IEEE Design and Test of Computers, vol. 20, no. 1, pp. 51-59, Jan./Feb. 2003, doi:10.1109/MDT.2003.1173053
Usage of this product signifies your acceptance of the Terms of Use.