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Conference Reports
May/June 2002 (vol. 19 no. 3)
pp. 116
ASCII Text
x 
 
Adam Osseiran, "Conference Reports," IEEE Design and Test of Computers, vol. 19, no. 3, pp. 116, May/June, 2002.
 
 
BibTex
x
 
@article{ 10.1109/MDT.2002.10019,
author = {Adam Osseiran},
title = {Conference Reports},
journal ={IEEE Design and Test of Computers},
volume = {19},
number = {3},
issn = {0740-7475},
year = {2002},
pages = {116},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2002.10019},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design and Test of Computers
TI - Conference Reports
IS - 3
SN - 0740-7475
SP
EP
EPD - 116
A1 - Adam Osseiran,
PY - 2002
VL - 19
JA - IEEE Design and Test of Computers
ER -
 

8th International Mixed-Signal Testing Workshop

Citation:
Adam Osseiran, "Conference Reports," IEEE Design and Test of Computers, vol. 19, no. 3, pp. 116, May/June 2002, doi:10.1109/MDT.2002.10019
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