Computational Aspects of Diffuse Optical Tomography

CiSE
2003
Issue No. 6 - November/December
Abstract - Computational Aspects of Diffuse Optical Tomography

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November/December 2003 (vol. 5 no. 6)

pp. 33-41

	ASCII Text	x
	Martin Schweiger, Adam Gibson, Simon R. Arridge, "Computational Aspects of Diffuse Optical Tomography," Computing in Science and Engineering, vol. 5, no. 6, pp. 33-41, November/December, 2003.

	BibTex	x
	@article{ 10.1109/MCISE.2003.1238702, author = {Martin Schweiger and Adam Gibson and Simon R. Arridge}, title = {Computational Aspects of Diffuse Optical Tomography}, journal ={Computing in Science and Engineering}, volume = {5}, number = {6}, issn = {1521-9615}, year = {2003}, pages = {33-41}, doi = {http://doi.ieeecomputersociety.org/10.1109/MCISE.2003.1238702}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - MGZN JO - Computing in Science and Engineering TI - Computational Aspects of Diffuse Optical Tomography IS - 6 SN - 1521-9615 SP33 EP41 EPD - 33-41 A1 - Martin Schweiger, A1 - Adam Gibson, A1 - Simon R. Arridge, PY - 2003 KW - optics KW - tomography KW - imaging KW - visualization VL - 5 JA - Computing in Science and Engineering ER -

Martin Schweiger, University College London

Adam Gibson, University College London

Simon R. Arridge, University College London

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MCISE.2003.1238702

Diffuse optical tomography (DOT) is a novel functional imaging modality for visualizing and continuously monitoring tissue and blood oxygenation levels, which is useful for brain imaging and tumor detection. Because of the nonlinearity of infrared light propagation in tissue, developing fast and robust reconstruction methods is the main challenge in making DOT a viable tool for clinical diagnostics.

Index Terms:

optics, tomography, imaging, visualization

Citation:

Martin Schweiger, Adam Gibson, Simon R. Arridge, "Computational Aspects of Diffuse Optical Tomography," Computing in Science and Engineering, vol. 5, no. 6, pp. 33-41, Nov./Dec. 2003, doi:10.1109/MCISE.2003.1238702

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