The authors of the paper "Statistical Performance Evaluation of Biometric Authentication Systems Using Random Effects Models," which appeared in the
IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 29, no. 4, pp. 517-530, Apr. 2007, would like to point out that the caption in Fig. 2 [
1 , p. 521] should have read: "Fig. 2. Sample images from the Cohn-Kanade database. Courtesy of Liu et al. [
2 ]."
S. Mitra is with the Information Sciences Institute, University of Southern California, 4676 Admirality Way, Suite 1001, Marina del Rey, CA 90292. E-mail: mitra@isi.edu.
M. Savvides is with the Department of Electrical and Computer Engineering & CyLab, Carnegie Mellon University, 5000 Forbes Avenue, Pittsburgh, PA 15213. E-mail: msavid@cs.cmu.edu.
A. Brockwell is with the Department of Statistics, Carnegie Mellon University, 5000 Forbes Avenue, Pittsburgh, PA 15213.
E-mail: abrock@stat.cmu.edu.