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VLSI Design 2007 covers all aspects of integrated circuit design,
technology, and related computer-aided design (CAD). The proceedings presents
and examines various aspects of VLSI Design, electronic design automation
(EDA), and VLSI technologies. It covers the entire spectrum of activities in
the two vital areas, which underpin the semiconductor industry. The 2007
conference conference theme is Technology challenges in the Nanoelectronics
Era, and to debate the future of Nanoelectronics and explore the solutions for
the future. This conference is instrumental for the development of the industry
as it provides a source for the exchange of ideas, intellectual stimulation,
and a vision of the future of VLSI technology.
Contents: Formal Verification; Scheduling for Embedded Processors;
Architecture and Design; RF Circuits; Technology Modeling and Simulation;
Compilation Techniques for Embedded Processors; Signal Integrity and Timing
Analysis; Digital Circuits; SOC Test and Verification; Dynamic and Runtime
Reconfigurable Systems; Synthesis and System Level Design; Low Power; Test
Generation and High Level Test; System Level Modeling, Estimation and
Exploration; Power Analysis and Optimization; Memory Design; Emerging
Technology; Architecture Enhancements for Embedded Processors; Process
Variation and Reliability; Hardware Architectures; Analog Test, Delay Test, and
Test Power; Application-Specific Custom Architectures; Physical Design and
Modeling; Analog Techniques
990 pages / 144 papers, 8.5" x 11"
Softcover
ISBN 978-0-7695-2762-8, January 2007
Catalog # P2762, $123.00 Members / $307.00 List
See Also [VLSID 2006] [VLSID 2005] [VLSID 2004] [VLSID 2003] [VLSID 2002] [VLSID
2001]
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