March/April 2008 The Current State of Test Compression
ISSUE HIGHLIGHTS:
From
the EIC
Test compression saves bits, cycles, and money
by Tim Cheng
This issue of IEEE Design & Test features a special section on the
current state of test compression.
Guest
Editors' Introduction: Progress in Test Compression
by Scott Davidson, Sun Microsystems, and Nur A. Touba, University of
Texas at Austin
This issue of IEEE Design & Test represents a snapshot of the
progress in test compression, a key strategy for dealing with rapidly growing
test data volume.
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