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IEEE Transactions on Pattern Analysis and Machine Intelligence
Sept. 2013 (vol. 35 no. 9)
ISSN: 0162-8828
Table of Contents
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REGULAR PAPERS
Qi Mao, Sch. of Comput. Eng., Nanyang Technol. Univ., Singapore, Singapore
I. W-H Tsang, Sch. of Comput. Eng., Nanyang Technol. Univ., Singapore, Singapore
pp. 2051-2063
V. N. Boddeti, Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
B. V. K. V. Kumar, Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
pp. 2064-2077
G. Bellala, Hewlett Packard Labs., Palo Alto, CA, USA
J. Stanley, Citadel Investment Group, Chicago, IL, USA
S. K. Bhavnani, Inst. for Translational Sci., Univ. of Texas Med. Branch, Galveston, TX, USA
C. Scott, Dept. of Electr. Eng. & Comput. Sci., Univ. of Michigan, Ann Arbor, MI, USA
pp. 2078-2090
P. Miraldo, Dept. of Electr. & Comput. Eng., Univ. of Coimbra, Coimbra, Portugal
H. Araujo, Dept. of Electr. & Comput. Eng., Univ. of Coimbra, Coimbra, Portugal
pp. 2091-2103
Lei Yuan, Dept. of Comput. Sci. & Eng., Arizona State Univ., Tempe, AZ, USA
Jun Liu, Siemens Corp. Res., Princeton, NJ, USA
Jieping Ye, Dept. of Comput. Sci. & Eng., Arizona State Univ., Tempe, AZ, USA
pp. 2104-2116
Yao Hu, State Key Lab. of CAD&CG, Zhejiang Univ., Hangzhou, China
Debing Zhang, State Key Lab. of CAD&CG, Zhejiang Univ., Hangzhou, China
Jieping Ye, Comput. Sci. & Eng. Dept., Arizona State Univ., Tempe, AZ, USA
Xuelong Li, State Key Lab. of Transicent Opt. & Photonics, Xi'an Inst. of Opt. & Precision Mech., Xi'an, China
Xiaofei He, State Key Lab. of CAD&CG, Zhejiang Univ., Hangzhou, China
pp. 2117-2130
Hairong Liu, Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore, Singapore
L. J. Latecki, Dept. of Comput. & Inf. Sci., Temple Univ., Philadelphia, PA, USA
Shuicheng Yan, Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore, Singapore
pp. 2131-2142
H. Lombaert, Centre for Intell. Machines, McGill Univ., Montreal, QC, Canada
L. Grady, HeartFlow, Redwood, CA, USA
J. R. Polimeni, Dept. of Radiol., Massachusetts Gen. Hosp., Charlestown, MA, USA
F. Cheriet, Ecole Polytech. de Montreal, Montreal, QC, Canada
pp. 2143-2160
A. Cherian, Dept. of Comput. Sci. & Eng., Univ. of Minnesota, Minneapolis, MN, USA
S. Sra, Dept. of Empirical Inference, Max Planck Inst. for Intell. Syst., Tubingen, Germany
A. Banerjee, Dept. of Comput. Sci. & Eng., Univ. of Minnesota, Minneapolis, MN, USA
N. Papanikolopoulos, Dept. of Comput. Sci. & Eng., Univ. of Minnesota, Minneapolis, MN, USA
pp. 2161-2174
KNN Matting (Abstract)
Qifeng Chen, Dept. of Comput. Sci., Stanford Univ., Stanford, CA, USA
Dingzeyu Li, Dept. of Comput. Sci., Columbia Univ., New York, NY, USA
Chi-Keung Tang, Dept. of Comput. Sci. & Eng., Hong Kong Univ. of Sci. & Technol., Hong Kong, China
pp. 2175-2188
Zhangzhang Si, Dept. of Stat., Univ. of California, Los Angeles, Los Angeles, CA, USA
Song-Chun Zhu, Dept. of Stat., Univ. of California, Los Angeles, Los Angeles, CA, USA
pp. 2189-2205
M. Ranzato, Dept. of Comput. Sci., Univ. of Toronto, Toronto, ON, Canada
V. Mnih, Dept. of Comput. Sci., Univ. of Toronto, Toronto, ON, Canada
J. M. Susskind, Machine Perception Lab., Univ. of California San Diego, La Jolla, CA, USA
G. E. Hinton, Dept. of Comput. Sci., Univ. of Toronto, Toronto, ON, Canada
pp. 2206-2222
Chang-Dong Wang, Sch. of Inf. Sci. & Technol., Sun Yat-sen Univ., Guangzhou, China
Jian-Huang Lai, Sch. of Inf. Sci. & Technol., Sun Yat-sen Univ., Guangzhou, China
Ching Y. Suen, Centre for Pattern Recognition & Machine Intell. (CENPARMI), Concordia Univ., Montreal, QC, Canada
Jun-Yong Zhu, Sch. of Math. & Comput. Sci., Sun Yat-sen Univ., Guangzhou, China
pp. 2223-2237
Yuchao Dai, Sch. of Electron. & Inf., Northwestern Polytech. Univ., Xi'an, China
Hongdong Li, NICTA, ANU, Canberra, ACT, Australia
Mingyi He, ShaanXi Key Lab. of Inf. Acquisition & Process., Northwestern Polytech. Univ., Xi'an, China
pp. 2238-2251
D. Thomas, Nat. Inst. of Inf., Tokyo, Japan
A. Sugimoto, Nat. Inst. of Inf., Tokyo, Japan
pp. 2252-2269
Hassen Drira, Lab. d'Inf. Fondamentale de Lille (LIFL), Inst. Mines-Telecom/Telecom Lille 1, Villeneuve d'Ascq, France
Boulbaba Ben Amor, Lab. d'Inf. Fondamentale de Lille (LIFL), Inst. Mines-Telecom/Telecom Lille 1, Villeneuve d'Ascq, France
A. Srivastava, Dept. of Stat., Florida State Univ., Tallahassee, FL, USA
M. Daoudi, Lab. d'Inf. Fondamentale de Lille (LIFL), Inst. Mines-Telecom/Telecom Lille 1, Villeneuve d'Ascq, France
R. Slama, Lab. d'Inf. Fondamentale de Lille (LIFL), Inst. Mines-Telecom/Telecom Lille 1, Villeneuve d'Ascq, France
pp. 2270-2283
E. Konukoglu, Med. Sch., Athinoula A. Martinos Center for Biomed. Imaging, Harvard Univ., Cambridge, MA, USA
B. Glocker, Microsoft Res. Cambridge, Cambridge, UK
A. Criminisi, Microsoft Res. Cambridge, Cambridge, UK
K. M. Pohl, Univ. of Pennsylvania, Philadelphia, PA, USA
pp. 2284-2297
SHORT PAPERS
V. Appia, Imaging Technol. Lab., Texas Instrum., Dallas, TX, USA
A. Yezzi, Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
pp. 2298-2304
B. Flach, Fac. of Electr. Eng., Czech Tech. Univ., Prague, Czech Republic
pp. 2304-2306
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