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IEEE Transactions on Pattern Analysis and Machine Intelligence
April 2013 (vol. 35 no. 4)
ISSN: 0162-8828
Table of Contents
REGULAR PAPERS
K. Audhkhasi, Electr. Eng. Dept., Univ. of Southern California, Los Angeles, CA, USA
S. Narayanan, Electr. Eng. Dept., Univ. of Southern California, Los Angeles, CA, USA
pp. 769-783
Yung-Hui Li, Dept. of Inf. Eng. & Comput. Sci., Feng Chia Univ., Taichung, Taiwan
M. Savvides, Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
pp. 784-796
Yansong Feng, Inst. of Comput. Sci. & Technol., Peking Univ., Beijing, China
M. Lapata, Inst. for Language, Cognition & Comput., Univ. of Edinburgh, Edinburgh, UK
pp. 797-812
R. Vera-Rodriguez, Biometric Recognition Group-ATVS, Univ. Autonoma de Madrid, Madrid, Spain
J. S. D. Mason, Speech & Image Res. Group, Swansea Univ., Swansea, UK
J. Fierrez, Biometric Recognition Group-ATVS, Univ. Autonoma de Madrid, Madrid, Spain
J. Ortega-Garcia, Biometric Recognition Group-ATVS, Univ. Autonoma de Madrid, Madrid, Spain
pp. 823-834
A. Prest, Comput. Vision Lab., ETH Zurich, Zurich, Switzerland
V. Ferrari, IPAB Inst., Univ. of Edinburgh, Edinburgh, UK
C. Schmid, LEAR Team, INRIA Rhone-Alpes, St. Ismier, France
pp. 835-848
A. Rajwade, DA-IICT, Gandhinagar, India
A. Rangarajan, Dept. of Comput. & Inf. Sci. & Eng., Univ. of Florida, Gainesville, FL, USA
A. Banerjee, Dept. of Comput. & Inf. Sci. & Eng., Univ. of Florida, Gainesville, FL, USA
pp. 849-862
Xi Li, Australian Centre for Visual Technol., Univ. of Adelaide, Adelaide, SA, Australia
A. Dick, Australian Centre for Visual Technol., Univ. of Adelaide, Adelaide, SA, Australia
Chunhua Shen, Australian Centre for Visual Technol., Univ. of Adelaide, Adelaide, SA, Australia
A. van den Hengel, Australian Centre for Visual Technol., Univ. of Adelaide, Adelaide, SA, Australia
Hanzi Wang, Sch. of Inf. Sci. & Technol., Xiamen Univ., Xiamen, China
pp. 863-881
C. Wojek, Max Planck Inst. for Inf., Saarbrucken, Germany
S. Walk, Photogrammetry & Remote Sensing Group, ETH Zurich, Zurich, Switzerland
S. Roth, GRIS, Tech. Univ. Darmstadt, Darmstadt, Germany
K. Schindler, Photogrammetry & Remote Sensing Group, ETH Zurich, Zurich, Switzerland
B. Schiele, Max Planck Inst. for Inf., Saarbrucken, Germany
pp. 882-897
Chang Huang, Baidu USA LLC, Cupertino, CA, USA
Yuan Li, Google, Inc., Los Angeles, CA, USA
R. Nevatia, Inst. for Robot. & Intell. Syst., Univ. of Southern California, Los Angeles, CA, USA
pp. 898-910
M. Ranjbar, Sch. of Comput. Sci., Simon Fraser Univ., Burnaby, BC, Canada
Tian Lan, Sch. of Comput. Sci., Simon Fraser Univ., Burnaby, BC, Canada
Yang Wang, Dept. of Comput. Sci., Univ. of Manitoba, Winnipeg, MB, Canada
S. N. Robinovitch, Sch. of Eng. Sci., Simon Fraser Univ., Burnaby, BC, Canada
Ze-Nian Li, Sch. of Comput. Sci., Simon Fraser Univ., Burnaby, BC, Canada
G. Mori, Sch. of Comput. Sci., Simon Fraser Univ., Burnaby, BC, Canada
pp. 911-924
Jianjiang Feng, Dept. of Autom., Tsinghua Univ., Beijing, China
Jie Zhou, Dept. of Autom., Tsinghua Univ., Beijing, China
A. K. Jain, Dept. of Comput. Sci. & Eng., Michigan State Univ., East Lansing, MI, USA
pp. 925-940
L. Čehovin, Fac. of Comput. & Inf. Sci., Univ. of Ljubljana, Ljubljana, Slovenia
M. Kristan, Fac. of Electr. Eng., Univ. of Ljubljana, Ljubljana, Slovenia
A. Leonardis, Centre for Comput. Neurosci. & Cognitive Robot., Univ. of Birmingham, Birmingham, UK
pp. 941-953
Heiko Bulow, Sch. of Eng. & Sci., Jacobs Univ. Bremen, Bremen, Germany
A. Birk, Sch. of Eng. & Sci., Jacobs Univ. Bremen, Bremen, Germany
pp. 954-969
Hien Van Nguyen, Dept. of Electr. & Comput. Eng., Univ. of Maryland, College Park, MD, USA
F. Porikli, Mitsubishi Electr. Res. Labs. (MERL), Cambridge, MA, USA
pp. 970-982
P. MomayyezSiahkal, Sch. of Comput. Sci., McGill Univ., Montreal, QC, Canada
K. Siddiqi, Sch. of Comput. Sci., McGill Univ., Montreal, QC, Canada
pp. 983-995
Jian Li, Inst. of Autom., Nat. Univ. of Defense Technol., Changsha, China
M. D. Levine, Dept. of Electr. & Comput. Eng., McGill Univ., Montreal, QC, Canada
Xiangjing An, Inst. of Autom., Nat. Univ. of Defense Technol., Changsha, China
Xin Xu, Inst. of Autom., Nat. Univ. of Defense Technol., Changsha, China
Hangen He, Inst. of Autom., Nat. Univ. of Defense Technol., Changsha, China
pp. 996-1010
Junseok Kwon, Dept. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ., Seoul, South Korea
Kyoung Mu Lee, Dept. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ., Seoul, South Korea
pp. 1011-1024
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