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IEEE Transactions on Pattern Analysis and Machine Intelligence
Dec. 2012 (vol. 34 no. 12)
ISSN: 0162-8828
Table of Contents
REGULAR PAPERS
Seon Joo Kim, SUNY Korea, Incheon, South Korea
Hai Ting Lin, Sch. of Comput., Nat. Univ. of Singapore, Singapore, Singapore
Zheng Lu, Sch. of Comput., Nat. Univ. of Singapore, Singapore, Singapore
Sabine Süsstrunk, IVRG, EPFL, Lausanne, Switzerland
S. Lin, Microsoft Res. Asia, Beijing, China
M. S. Brown, Sch. of Comput., Nat. Univ. of Singapore, Singapore, Singapore
pp. 2289-2302
R. Hartley, Sch. of Eng. (RSISE), Australian Nat. Univ., Canberra, ACT, Australia
Hongdong Li, Sch. of Eng. (RSISE), Australian Nat. Univ., Canberra, ACT, Australia
pp. 2303-2314
M. Cohen, Comput. Sci. Dept., Technion - Israel Inst. of Technol., Haifa, Israel
I. Shimshoni, Dept. of Inf. Syst., Univ. of Haifa, Haifa, Israel
E. Rivlin, Comput. Sci. Dept., Technion - Israel Inst. of Technol., Haifa, Israel
A. Adam, Microsoft, Haifa, Israel
pp. 2327-2340
Jingu Heo, Samsung Adv. Inst. of Technol., Yongin, South Korea
M. Savvides, Cylab Biometrics Center, Carnegie Mellon Univ., Pittsburgh, PA, USA
pp. 2341-2350
S. Mittal, Dept. of Stat., Columbia Univ., New York, NY, USA
S. Anand, Dept. of Electr. & Comput. Eng., Rutgers Univ., Piscataway, NJ, USA
P. Meer, Dept. of Electr. & Comput. Eng., Rutgers Univ., Piscataway, NJ, USA
pp. 2351-2364
Ning Chen, Dept. of Comput. Sci. & Technol., Tsinghua Univ., Beijing, China
Jun Zhu, Dept. of Comput. Sci. & Technol., Tsinghua Univ., Beijing, China
Fuchun Sun, Dept. of Comput. Sci. & Technol., Tsinghua Univ., Beijing, China
E. P. Xing, Sch. of Comput. Sci., Carnegie Mellon Univ., Pittsburgh, PA, USA
pp. 2365-2378
B. Kerautret, LORIA, Univ. of Lorraine, Vandoeuvre-les-Nancy, France
J-O Lachaud, Lab. de Math. (LAMA), Univ. of Savoie, Le-Bourget-du-Lac, France
pp. 2379-2392
Jun Wang, Bus. Analytics & Math. Sci. Dept., IBM T.J. Watson Res. Center, Yorktown Heights, NY, USA
S. Kumar, Google Res., New York, NY, USA
Shih-Fu Chang, Dept. of Electr. & Comput. Eng., Columbia Univ., New York, NY, USA
pp. 2393-2406
Meizhu Liu, Dept. of CISE, Univ. of Florida, Gainesville, FL, USA
B. C. Vemuri, Dept. of CISE, Univ. of Florida, Gainesville, FL, USA
Shun-Ichi Amari, Math. Neurosci. Lab., RIKEN Brain Sci. Inst., Wako, Japan
F. Nielsen, Ecole Polytech., Palaiseau, France
pp. 2407-2419
Weiming Hu, Nat. Lab. of Pattern Recognition, Inst. of Autom., Beijing, China
Xi Li, Nat. Lab. of Pattern Recognition, Inst. of Autom., Beijing, China
Wenhan Luo, Nat. Lab. of Pattern Recognition, Inst. of Autom., Beijing, China
Xiaoqin Zhang, Nat. Lab. of Pattern Recognition, Inst. of Autom., Beijing, China
S. Maybank, Dept. of Comput. Sci. & Inf. Syst., Birkbeck Coll., London, UK
Zhongfei Zhang, Dept. of Comput. Sci., Binghamton Univ., Binghamton, NY, USA
pp. 2420-2440
A. Patron-Perez, Dept. of Comput. Sci., George Washington Univ., Washington, DC, USA
M. Marszalek, Google, Inc., Adliswil, Switzerland
I. Reid, Dept. of Eng. Sci., Univ. of Oxford, Oxford, UK
A. Zisserman, Dept. of Eng. Sci., Univ. of Oxford, Oxford, UK
pp. 2441-2453
G. Tzimiropoulos, Sch. of Comput. Sci., Univ. of Lincoln, Lincoln, UK
S. Zafeiriou, Dept. of Comput., Imperial Coll. London, London, UK
M. Pantic, Dept. of Comput., Imperial Coll. London, London, UK
pp. 2454-2466
Pingping Xiu, Microsoft Advertising R&D, Redmond, WA, USA
H. S. Baird, Dept. of Comput. Sci. & Eng., Lehigh Univ., Bethlehem, PA, USA
pp. 2467-2480
SHORT PAPERS
Mani Malek Esmaeili, Electr. & Comput. Eng. Dept., Univ. of British Columbia, Vancouver, BC, Canada
R. K. Ward, Electr. & Comput. Eng. Dept., Univ. of British Columbia, Vancouver, BC, Canada
M. Fatourechi, Electr. & Comput. Eng. Dept., Univ. of British Columbia, Vancouver, BC, Canada
pp. 2481-2488
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