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IEEE Transactions on Pattern Analysis and Machine Intelligence
November 2011 (vol. 33 no. 11)
ISSN: 0162-8828
Table of Contents
EDITORIAL
REGULAR PAPERS
Daniel Neilson, University of Saskatchewan, Saskatoon and University of Alberta, Edmonton
Yee-Hong Yang, University of Alberta, Edmonton
pp. 2147-2159
Zhanyu Ma, KTH -- Royal Institute of Technology, Stockholm
Arne Leijon, KTH -- Royal Institute of Technology, Stockholm
pp. 2160-2173
Daozheng Chen, University of Maryland, College Park
Mustafa Bilgic, Illinois Institute of Technology, Chicago
Lise Getoor, University of Maryland, College Park
David Jacobs, University of Maryland, College Park
pp. 2174-2187
Juergen Gall, ETH Zurich, Zurich
Angela Yao, ETH Zurich, Zurich
Nima Razavi, ETH Zurich, Zurich
Luc Van Gool, ETH Zurich, Zurich and IBBT, K.U., Leuven
Victor Lempitsky, University of Oxford, Oxford
pp. 2188-2202
Samuel W. Hasinoff, Toyota Technological Institute at Chicago, Chicago
Kiriakos N. Kutulakos, University of Toronto, Toronto
pp. 2203-2214
Rodrigo Moreno, Linköping University, Linköping and Rovira i Virgili University, Tarragona
Miguel Angel Garcia, Autonomous University of Madrid, Madrid
Domenec Puig, Rovira i Virgili University, Tarragona
Luis Pizarro, Imperial College London, London
Bernhard Burgeth, Saarland Univesity, Saarbrücken
Joachim Weickert, Saarland Univesity, Saarbrücken
pp. 2215-2228
Dimitris Arabadjis, National Techncal University of Athens, Athens
Panayiotis Rousopoulos, National Techncal University of Athens, Athens
Constantin Papaodysseus, National Techncal University of Athens, Athens
Michalis Exarhos, National Techncal University of Athens, Athens
Michail Panagopoulos, Ionian University, Corfu
Lena Papazoglou-Manioudaki, National Archaeological Museum of Greece, Athens
pp. 2229-2244
Li Tang, University of Iowa, Iowa City
Mona K. Garvin, University of Iowa, Iowa City
Kyungmoo Lee, University of Iowa, Iowa City
Wallace L.M. Alward, University of Iowa, Iowa City
Young H. Kwon, University of Iowa, Iowa City
Michael D. Abràmoff, University of Iowa, Iowa City
pp. 2245-2258
Xue Mei, University of Maryland, Folsom
Haibin Ling, Temple University, Philadelphia
pp. 2259-2272
Pavan Turaga, University of Maryland, College Park
Ashok Veeraraghavan, Mitsubishi Electrical Research Labs, Cambridge
Anuj Srivastava, Florida State University, Tallahassee
Rama Chellappa, University of Maryland, College Park
pp. 2273-2286
Brendan Tran Morris, University of California, San Diego, La Jolla
Mohan Manubhai Trivedi, University of California, San Diego, La Jolla
pp. 2287-2301
Evgeniy Bart, Palo Alto Research Center, Palo Alto
Max Welling, University of California Irvine, Irvine
Pietro Perona, California Institute of Technology, Pasadena
pp. 2302-2315
SHORT PAPERS
Ron Kimmel, Technion, Haifa
Cuiping Zhang, CMART Systems, Inc., Santa Clara
Alexander M. Bronstein, Tel Aviv University, Tel Aviv
Michael M. Bronstein, Universita' della Svizzera Italiana, Lugano
pp. 2316-2320
Hai Ting Lin, National University of Singapore, Singapore
Yu-Wing Tai, Korean Advanced Institute of Science and Technology, Daejeon
Michael S. Brown, National University of Singapore, Singapore
pp. 2329-2336
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