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IEEE Transactions on Pattern Analysis and Machine Intelligence
July 2011 (vol. 33 no. 7)
ISSN: 0162-8828
Table of Contents
Regular Papers
Ning Zhou, University of North Carolina, Charlotte
William K. Cheung, Hong Kong Baptist University, Hong Kong
Guoping Qiu, University of Nottingham, Nottingham
Xiangyang Xue, Fudan University, Shanghai
pp. 1281-1294
Dheeraj Singaraju, The Johns Hopkins University, Baltimore
René Vidal, The Johns Hopkins University, Baltimore
pp. 1295-1309
Yang Wang, University of Illinois at Urbana-Champaign, Urbana
Greg Mori, Simon Fraser University, Burnaby
pp. 1310-1323
S.M. Shahed Nejhum, University of Florida, Gainesville
Yu-Tseh Chi, University of Florida, Gainesville
Jeffrey Ho, University of Florida, Gainesville
Ming-Hsuan Yang, University of California at Merced, Merced
pp. 1324-1338
Hao Jiang, Boston College, Chestnut Hill
Stella X. Yu, Boston College, Chestnut Hill
David R. Martin, Google Inc., Mountain View
pp. 1339-1355
Yu-Ting Tsai, Yuan Ze University, Chung-Li City
Kuei-Li Fang, National Chiao Tung University, Hsinchu
Wen-Chieh Lin, National Chiao Tung University, Hsinchu
Zen-Chung Shih, National Chiao Tung University, Hsinchu
pp. 1356-1369
Moshe Ben-Ezra, Microsoft Research Asia, Beijing
Zhouchen Lin, Microsoft Research Asia, Beijing
Bennett Wilburn, Refocus Imaging
Wei Zhang, The Chinese University of Hong Kong, Hong Kong
pp. 1370-1383
Camille Couprie, Université Paris-Est, ESIEE, Noisy-le-Grand
Leo Grady, Siemens Corporate Research, Princeton
Laurent Najman, Université Paris-Est, ESIEE, Noisy-le-Grand
Hugues Talbot, Université Paris-Est, ESIEE, Noisy-le-Grand
pp. 1384-1399
Jiejie Zhu, University of Kentucky, Lexington
Liang Wang, University of Kentucky, Lexington
Ruigang Yang, University of Kentucky, Lexington
James E. Davis, University of California, Santa Cruz
Zhigeng Pan, Zhejiang University, Hangzhou
pp. 1400-1414
Anuj Srivastava, Florida State University, Tallahassee
Eric Klassen, Florida State University, Tallahassee
Shantanu H. Joshi, UCLA School of Medicine, Los Angeles
Ian H. Jermyn, Durham University, Durham
pp. 1415-1428
Wonwoo Lee, Gwnagju Institute of Science and Technology, Gwangju
Woontack Woo, Gwnagju Institute of Science and Technology, Gwangju
Edmond Boyer, INRIA Grenoble Rhône-Alpes, Saint Ismier
pp. 1429-1441
Ijaz Akhter, Lahore University of Management Sciences, Lahore
Yaser Sheikh, Carnegie Mellon University, Pittsburgh
Sohaib Khan, Lahore University of Management Sciences, Lahore
Takeo Kanade, Carnegie Mellon University, Pittsburgh
pp. 1442-1456
Matthew J. Leotta, Kitware, Inc., Clifton Park
Joseph L. Mundy, Brown University, Providence
pp. 1457-1469
Short Papers
Albrecht Irle, University of Kiel, Kiel
Jonas Kauschke, University of Kiel, Kiel
pp. 1482-1486
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