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IEEE Transactions on Pattern Analysis and Machine Intelligence
June 2011 (vol. 33 no. 6)
ISSN: 0162-8828
Table of Contents
 | Regular Papers |
Samuel Dambreville, Georgia Institute of Technology, Atlanta and the Boston Consulting Group
Allen Tannenbaum, Georgia Institute of Technology, Atlanta and Technion, Israel-Institute of Technology, Haifa
pp. 1098-1115
Bo Peng, Arizona State University, Tempe
pp. 1175-1188
Yuhua Li, University of Ulster, Londonderry
pp. 1189-1201
Qiang Cheng, Southern Illinois University Carbondale, Carbondale
Hongbo Zhou, Southern Illinois University Carbondale, Carbondale
pp. 1217-1233
 | Short Papers |
Yuchi Huang, Rutgers University at New Brunswick, Piscataway
Qingshan Liu, Rutgers University at New Brunswick, Piscataway
Fengjun Lv, NEC Laboratories America, Inc, Cupertino
pp. 1266-1273
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