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IEEE Transactions on Pattern Analysis and Machine Intelligence
May 2011 (vol. 33 no. 5)
ISSN: 0162-8828
Table of Contents
Editorial
Regular Papers
Hae Jong Seo, University of California Santa Cruz, Santa Cruz
Peyman Milanfar, University of California Santa Cruz, Santa Cruz
pp. 867-882
Andrew Gilbert, University of Surrey, Guildford
John Illingworth, University of Surrey, Guildford
Richard Bowden, University of Surrey, Guildford
pp. 883-897
Pablo Arbeláez, University of California at Berkeley, Berkeley
Michael Maire, California Institute of Technology, Pasadena
Charless Fowlkes, University of California at Irvine, Irvine
Jitendra Malik, University of California at Berkeley, Berkeley
pp. 898-916
Eduard Vazquez, Universitat Autonoma de Barcelona, Barcelona
Ramon Baldrich, Universitat Autonoma de Barcelona, Barcelona
Joost van de Weijer, Universitat Autonoma de Barcelona, Barcelona
Maria Vanrell, Universitat Autonoma de Barcelona, Barcelona
pp. 917-930
Mathieu Salzmann, Toyota Technological Institute at Chicago, Chicago
Pascal Fua, Ecole Polytechnique Fédérale (EPFL), Lausanane
pp. 931-944
Jifeng Dai, Tsinghua University, Beijing
Jie Zhou, Tsinghua University, Beijing
pp. 945-957
Zhouyu Fu, Monash University, Victoria
Antonio Robles-Kelly, National ICT Australia, Canberra Research Laboratory, Canberra and Australian National University
Jun Zhou, National ICT Australia, Canberra Research Laboratory, Canberra and Australian National University
pp. 958-977
Ce Liu, Microsoft Research New England, Cambridge
Jenny Yuen, Massachusetts Institute of Technology, Cambridge
Antonio Torralba, Massachusetts Institute of Technology, Cambridge
pp. 978-994
Uma Mudenagudi, BVB College of Engineering and Technology, Hubli
Subhashis Banerjee, IIT Delhi, New Delhi
Prem Kumar Kalra, IIT Delhi, New Delhi
pp. 995-1008
Xiaojun Quan, City University of Hong Kong, Hong Kong
Wenyin Liu, City University of Hong Kong, Hong Kong
Bite Qiu, City University of Hong Kong, Hong Kong
pp. 1009-1021
Yiming Liu, Nanyang Technological University, Singapore
Dong Xu, Nanyang Technological University, Singapore
Ivor Wai-Hung Tsang, Nanyang Technological University, Singapore
Jiebo Luo, Kodak Research Laboratories, Eastman Kodak Company, Rochester
pp. 1022-1036
Wei Bian, University of Technology, Sydney
Dacheng Tao, University of Technology, Sydney
pp. 1037-1050
Short Papers
Raffaele Cappelli, DEIS-Università di Bologna, Cesena
Matteo Ferrara, DEIS-Università di Bologna, Cesena
Davide Maltoni, University of Bologna, Cesena
pp. 1051-1057
Michael M. Bronstein, Technion - Israel Institute of Technology, Haifa
Alexander M. Bronstein, Tel-Aviv University, Tel-Aviv
pp. 1065-1071
Call For Papers
Simbad 2011 (PDF)
pp. 1072-1072
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