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IEEE Transactions on Pattern Analysis and Machine Intelligence
February 2010 (vol. 32 no. 2)
ISSN: 0162-8828
Table of Contents
REGULAR PAPERS
Gianluigi Pillonetto, University of Padova, Padova
Francesco Dinuzzo, University of Pavia, Pavia
Giuseppe De Nicolao, University of Pavia, Pavia
pp. 193-205
Chauã C. Queirolo, Universidade Federal do Parana, Curitiba
Luciano Silva, Universidade Federal do Parana, Curitiba
Olga R.P. Bellon, Universidade Federal do Parana, Curitiba
Maurício Pamplona Segundo, Universidade Federal do Parana, Curitiba
pp. 206-219
Neil Yager, Biometix, Eveleigh
Ted Dunstone, Biometix, Sydney
pp. 220-230
Song-Gang Xu, Tsinghua University, Beijing
Yun-Xiang Zhang, Tsinghua University, Beijing
Jun-Hai Yong, Tsinghua University, Beijing
pp. 231-241
Olivier Laligant, Université de Bourgogne, Le Creusot
Frédéric Truchetet, Université de Bourgogne, Le Creusot
pp. 242-257
Yan Tong, GE Global Research Center, Niskayuna
Jixu Chen, Rensselaer Polytechnic Institute, Troy
Qiang Ji, Rensselaer Polytechnic Institute, Troy
pp. 258-273
Qi Zhao, University of California, Santa Cruz, Santa Cruz
Zhi Yang, University of California, Santa Cruz, Santa Cruz
Hai Tao, University of California, Santa Cruz, Santa Cruz
pp. 274-287
Saad Ali, Carnegie Mellon University, Pittsburgh
Mubarak Shah, University of Central Florida, Orlando
pp. 288-303
Flávio L.C. Pádua, Centro Federal de Educação Tecnológica de Minas Gerais , Belo Horizonte
Rodrigo L. Carceroni, Google Inc, Mountain View
Geraldo A.M.R. Santos, Universidade Federal de Minas Gerais, Belo Horizonte
Kiriakos N. Kutulakos, University of Toronto , Toronto
pp. 304-320
Tim K. Marks, Mitsubishi Electric Research Laboratories, Cambridge
John R. Hershey, IBM T. J. Watson Research Center, Yorktown Heights
Javier R. Movellan, University of California San Diego, La Jolla
pp. 348-363
SHORT PAPERS
Ondř;ej Chum, Czech Technical University, Prague
Jiř;í Matas, Czech Technical University, Prague
pp. 371-377
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