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IEEE Transactions on Pattern Analysis and Machine Intelligence
January 2010 (vol. 32 no. 1)
ISSN: 0162-8828
Table of Contents
 | EDITORIAL |
 | REGULAR PAPERS |
Liu Yang, Carnegie Mellon University, Pittsburgh
Rong Jin, Michigan State University, East Lansing
Adam Goode, Carnegie Mellon University, Pittsburgh
Bin Zheng, University of Pittsburgh, Pittsburgh
pp. 30-44
Chris Ding, University of Texas at Arlington, Arlington
Tao Li, Florida International University, Miami
pp. 45-55
Kinh Tieu, The Chinese University of Hong Kong, Hong Kong
pp. 56-71
Gang Li, Siemens Corporate Research, Princeton
pp. 72-86
Reid Porter, Los Alamos National Laboratory, Los Alamos
pp. 105-119
Sergio Escalera, Universitat de Barcelona and Universitate Autonoma de Barcelona, Barcelona
Oriol Pujol, Universitat de Barcelona and Universitate Autonoma de Barcelona, Barcelona
Petia Radeva, Universitat de Barcelona and Universitate Autonoma de Barcelona, Barcelona
pp. 120-134
Florent Lafarge, Ariana Research Group, INRIA and Matis Laboratory, French Mapping Agency, Sophia Antipolis
pp. 135-147
 | SHORT PAPERS |
Wanli Ouyang, The Chinese University of Hong Kong, Hong Kong
pp. 165-171
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