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IEEE Transactions on Pattern Analysis and Machine Intelligence
October 2009 (vol. 31 no. 10)
ISSN: 0162-8828
Table of Contents
 | SPECIAL SECTION ON PROBABALISTIC GRAPHICAL MODELS |
Yuanhao Chen, University of Science and Technology of China, Hefei
Alan Yuille, University of California, Los Angeles, Los Angeles
pp. 1747-1761
Minwoo Park, Pennsylvania State University, University Park
Yanxi Liu, Pennsylvania State University, University Park
pp. 1804-1816
Luc van Gool, ETH Zurich, Switzerland and KU Leuven, Belgium
pp. 1831-1846
 | REGULAR PAPERS |
Guo-Jun Qi, University of Illinois at Urbana-Champaign, Urbana
Yong Rui, Microsoft China R&D Group, Beijing
Jinhui Tang, National University of Singapore, Singapore
pp. 1880-1897
 | SHORT PAPERS |
Mark Stuff, Michigan Tech Research Institute, Ann Arbor
pp. 1906-1912
Dong Xu, Nanyang Technological University, Singapore
pp. 1913-1920
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