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IEEE Transactions on Pattern Analysis and Machine Intelligence
March 2009 (vol. 31 no. 3)
ISSN: 0162-8828
Table of Contents
Regular Papers
Tali Treibitz, Technion - Israel Institute of Technology , Haifa
Yoav Y. Schechner, Technion - Israel Institute of Technology, Haifa
pp. 385-399
Wei Pan, Tsinghua University, Beijing
Kaihuai Qin, Tsinghua University, Beijing
Yao Chen, Tsinghua University, Beijing
pp. 400-414
Jean-Sébastien Franco, LaBRI CNRS-INRIA Sud-Ouest-Equipe IPARLA, France
Edmond Boyer, INRIA Rhône-Alpes, France
pp. 414-427
Wei Xiong, The Chinese University of Hong Kong, Hong Kong
Hin Shun Chung, The Chinese University of Hong Kong, Hong Kong
Jiaya Jia, The Chinese University of Hong Kong, Shatin
pp. 428-443
Rodrigo Palma-Amestoy, Universidad de Chile , Santiago
Edoardo Provenzi, Università di Milano, Crema
Marcelo Bertalmío, Universitat Pompeu Fabra, Barcelona
Vincent Caselles, Universitat Pompeu Fabra, Barcelona
pp. 458-474
Qingxiong Yang, University of Illinois at Urbana Champaign, Urbana
Liang Wang, University of Kentucky, Lexington
Ruigang Yang, University of Kentucky, Lexington
Henrik Stewénius, Google Switzerland, Zurich
David Nistér, Microsoft Corp., Redmond
pp. 492-504
Saad M. Khan, University of Central Florida, Orlando
Mubarak Shah, University of Central Florida, Orlando
pp. 505-519
Ahmed Elgammal, Rutgers University, Piscataway
Chan-Su Lee, Rutgers University, Piscataway
pp. 520-538
Short Papers
Richard j. Gardner, Western Washington University, Bellingham
Markus Kiderlen, University of Aarhus, Aarhus
pp. 556-562
Ali Shahrokni, University of Oxford, UK
Tom Drummond, University of Cambridge, UK
François Fleuret, IDIAP Research Institute, Switzerland
Pascal Fua, Ecole Polytechnic Fédérale de Lausanne, Switzerland
pp. 570-576
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