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IEEE Transactions on Pattern Analysis and Machine Intelligence
February 2009 (vol. 31 no. 2)
ISSN: 0162-8828
Table of Contents
 | Regular Papers |
David Doermann, University of Maryland at College Park, USA, College Park
pp. 193-209
John Wright, University of Illinois at Urbana-Champaign, Urbana
Arvind Ganesh, University of Illinois at Urbana-Champaign, Urbana
Yi Ma, University of Illinois at Urbana-Champaign, Urbana
pp. 210-227
Dacheng Tao, Birkbeck College, University of London, London
pp. 260-274
Layne T. Watson, Virginia Polytechnic Institute and State Univeristy, Blacksburg
pp. 275-287
Xin Dang, University of Mississippi, University
Henry L. Bart Jr., Tulane University and Tulane University Museum of Natural History, New Orleans
pp. 288-305
John Garofolo, National Institute of Standards and Technology, Gaithersburg
Rachel Bowers, National Institute of Standards and Technology, Gaithersburg
pp. 319-336
 | Short Papers |
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