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IEEE Transactions on Pattern Analysis and Machine Intelligence
October 2008 (vol. 30 no. 10)
ISSN: 0162-8828
Table of Contents
Bastian Leibe, ETH Zurich, Zurich
Konrad Schindler, ETH Zurich, Zurich
Nico Cornelis, KU Leuven, Leuven
Luc Van Gool, ETH Zurich KU Leuven, Zurich Leuven
pp. 1683-1698
Spectral Matting (Abstract)
Anat Levin, MIT, cambridge
Alex Rav-Acha, The Hebrew University of Jerusalem, Jerusalem
Dani Lischinski, The Hebrew University of Jerusalem, Jerusalem
pp. 1699-1712
Oncel Tuzel, Rutgers University, Piscataway
Fatih Porikli, Mitsubishi Electric Research Labs., Cambridge
Peter Meer, Rutgers University, Piscataway
pp. 1713-1727
Yuan Li, University of Southern California, Los Angeles
Haizhou Ai, Tsinghua University, Beijing
Takayoshi Yamashita, OMRON Corporation, Kyoto
Shihong Lao, OMRON Corporation, Kyoto
Masato Kawade, OMRON Corporation, Kyoto
pp. 1728-1740
Regular Papers
Short Papers
Arvind Bhusnurmath, GRASP Laboratory, Philadelphia
Camillo J. Taylor, GRASP Laboratory, Philadelphia
pp. 1866-1871
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