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IEEE Transactions on Pattern Analysis and Machine Intelligence
August 2008 (vol. 30 no. 8)
ISSN: 0162-8828
Table of Contents
Papers
Short Notes
Takahiro Toyoda, Tokyo Institute of Technology, Kanagawa-ken
Osamu Hasegawa, Tokyo Institute of Technology, Yokohama
pp. 1483-1489
Yi Guo, University of New England, Armidale
Junbin Gao, Charles Sturt Universtiy, Bathurst
Paul W. Kwan, University of New England, Armidale
pp. 1490-1495
Jacob Goldberger, Bar-Ilan University, Ramt-Gan
Hayit K. Greenspan, Tel-Aviv University, Tel-Aviv
Jeremie Dreyfuss, Tel-Aviv University, Tel-Aviv
pp. 1496-1502
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