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IEEE Transactions on Pattern Analysis and Machine Intelligence
December 2006 (vol. 28 no. 12)
ISSN: 0162-8828
Table of Contents
Papers
Introduction of New Associate Editors
(HTML)
pp. 1889-1891
ABSTRACT
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Random Multispace Quantization as an Analytic Mechanism for BioHashing of Biometric and Random Identity Inputs
(Abstract)
Andrew B.J. Teoh
, IEEE
Alwyn Goh
David C.L. Ngo
, IEEE
pp. 1892-1901
ABSTRACT
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Validating a Biometric Authentication System: Sample Size Requirements
(Abstract)
Sarat C. Dass
, IEEE
Yongfang Zhu
Anil K. Jain
, IEEE
pp. 1902-1319
ABSTRACT
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Recovering Facial Shape Using a Statistical Model of Surface Normal Direction
(Abstract)
William A.P. Smith
, IEEE
Edwin R. Hancock
pp. 1914-1930
ABSTRACT
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MILES: Multiple-Instance Learning via Embedded Instance Selection
(Abstract)
Yixin Chen
, IEEE
Jinbo Bi
, IEEE
James Z. Wang
, IEEE
pp. 1931-1947
ABSTRACT
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Bayesian Gaussian Process Classification with the EM-EP Algorithm
(Abstract)
Hyun-Chul Kim
Zoubin Ghahramani
, IEEE
pp. 1948-1959
ABSTRACT
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MCMC Data Association and Sparse Factorization Updating for Real Time Multitarget Tracking with Merged and Multiple Measurements
(Abstract)
Zia Khan
Tucker Balch
, IEEE
Frank Dellaert
, IEEE
pp. 1960-1972
ABSTRACT
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On the Distribution of Saliency
(Abstract)
Alexander Berengolts
Michael Lindenbaum
pp. 1973-1990
ABSTRACT
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Shape Representation and Classification Using the Poisson Equation
(Abstract)
Lena Gorelick
Meirav Galun
Eitan Sharon
, IEEE Computer Society
Ronen Basri
, IEEE Computer Society
Achi Brandt
pp. 1991-2005
ABSTRACT
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Dynamic Shape and Appearance Models
(Abstract)
Gianfranco Doretto
, IEEE
Stefano Soatto
, IEEE
pp. 2006-2019
ABSTRACT
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Short Papers
Symbol Recognition with Kernel Density Matching
(Abstract)
Wan Zhang
Liu Wenyin
, IEEE
Kun Zhang
pp. 2020-2024
ABSTRACT
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Robust Pose Estimation from a Planar Target
(Abstract)
Gerald Schweighofer
Axel Pinz
, IEEE
pp. 2024-2030
ABSTRACT
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Geometric Interpretations of the Relation between the Image of the Absolute Conic and Sphere Images
(Abstract)
Xianghua Ying
Hongbin Zha
pp. 2031-2036
ABSTRACT
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Face Description with Local Binary Patterns: Application to Face Recognition
(Abstract)
Timo Ahonen
, IEEE
Abdenour Hadid
Matti Pietik?inen
, IEEE
pp. 2037-2041
ABSTRACT
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A Luminance- and Contrast-Invariant Edge-Similarity Measure
(Abstract)
Saravana Kumar
Sim Heng Ong
, IEEE
Surendra Ranganath
Fook Tim Chew
pp. 2042-2048
ABSTRACT
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Annual Index
Annual Index
(PDF)
pp. Not in print
ABSTRACT
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