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IEEE Transactions on Pattern Analysis and Machine Intelligence
October 2006 (vol. 28 no. 10)
ISSN: 0162-8828
Table of Contents
Short Papers
Papers
A.S. Mian, Sch. of Comput. Sci. & Software Eng., Western Australia Univ., Nedlands, WA
M. Bennamoun, Sch. of Comput. Sci. & Software Eng., Western Australia Univ., Nedlands, WA
R. Owens, Sch. of Comput. Sci. & Software Eng., Western Australia Univ., Nedlands, WA
pp. 1584-1601
S. Manay, Div. of Electron. Eng. Technol., Lawrence Livermore Nat. Lab., CA
pp. 1602-1618
A. Kadyrov, Dept. of Electr. & Electron. Eng., Imperial Coll., London
M. Petrou, Dept. of Electr. & Electron. Eng., Imperial Coll., London
pp. 1631-1645
T.S. Caetano, Nat. ICT Australia, Canberra, ACT
T. Caelli, Nat. ICT Australia, Canberra, ACT
pp. 1646-1663
G.G.M. Snoek, Inst. of Informatics, Amsterdam Univ.
M. Worring, Inst. of Informatics, Amsterdam Univ.
J.M. Geusebroek, Inst. of Informatics, Amsterdam Univ.
D.C. Koelma, Inst. of Informatics, Amsterdam Univ.
F.J. Seinstra, Inst. of Informatics, Amsterdam Univ.
A.W.M. Smeulders, Inst. of Informatics, Amsterdam Univ.
pp. 1678-1689
R. Donner, Pattern Recognition & Image Process. Group, Vienna Univ. of Technol.
M. Reiter, Pattern Recognition & Image Process. Group, Vienna Univ. of Technol.
G. Langs, Pattern Recognition & Image Process. Group, Vienna Univ. of Technol.
pp. 1690-1694
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