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IEEE Transactions on Pattern Analysis and Machine Intelligence
June 2003 (vol. 25 no. 6)
ISSN: 0162-8828
Table of Contents
SPECIAL SECTION ON PERCEPTUAL ORGANIZATION IN COMPUTER VISION
Guest Editors' Introduction to the Special Section on Perceptual Organization in Computer Vision
(HTML)
David W. Jacobs
, IEEE
Michael Lindenbaum
, IEEE
pp. 641
ABSTRACT
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An In-Depth Study of Graph Partitioning Measures for Perceptual Organization
(Abstract)
Padmanabhan Soundararajan
, IEEE
Sudeep Sarkar
, IEEE
pp. 642-660
ABSTRACT
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Contour Grouping with Prior Models
(Abstract)
James H. Elder
, IEEE
Amnon Krupnik
Leigh A. Johnston
, IEEE
pp. 661-674
ABSTRACT
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Image Segmentation with Ratio Cut
(Abstract)
Song Wang
, IEEE
Jeffrey Mark Siskind
, IEEE
pp. 675-690
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Statistical Modeling and Conceptualization of Visual Patterns
(Abstract)
Song-Chun Zhu
pp. 691-712
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PAPERS
Contrast Restoration of Weather Degraded Images
(Abstract)
Srinivasa G. Narasimhan
Shree K. Nayar
pp. 713-724
ABSTRACT
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A Bayesian Discriminating Features Method for Face Detection
(Abstract)
Chengjun Liu
, IEEE
pp. 725-740
ABSTRACT
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Mosaicing New Views: The Crossed-Slits Projection
(Abstract)
Assaf Zomet
Doron Feldman
Shmuel Peleg
, IEEE
Daphna Weinshall
, IEEE Computer society
pp. 741-754
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A Topology Preserving Level Set Method for Geometric Deformable Models
(Abstract)
Xiao Han
, IEEE
Chenyang Xu
, IEEE
Jerry L. Prince
, IEEE
pp. 755-768
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SHORT PAPERS
Expandable Bayesian Networks for 3D Object Description from Multiple Views and Multiple Mode Inputs
(Abstract)
ZuWhan Kim
, IEEE Computer Society
Ramakant Nevatia
, IEEE
pp. 769-774
ABSTRACT
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The Generic Viewpoint Assumption and Planar Bias
(Abstract)
A.L. Yuille
, IEEE
James M. Coughlan
S. Konishi
pp. 775-778
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Feature Selection for Multiclass Discrimination via Mixed-Integer Linear Programming
(Abstract)
Frank J. Iannarilli Jr.
, IEEE
Paul A. Rubin
pp. 779-783
ABSTRACT
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CALL FOR PAPERS: IEEE Transactions on Pattern Analysis and Machine Intelligence, Special Issue on Syntactic and Structural Pattern Recognition
(PDF)
pp. 784
ABSTRACT
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