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IEEE Transactions on Pattern Analysis and Machine Intelligence
January 1988 (vol. 10 no. 1)
ISSN: 0162-8828
Table of Contents
Introduction to the Special PAMI Issues on Industrial Machine Vision and Computer Vision Technology
Introduction to the Special PAMI Issues on Industrial Machine Vision and Computer Vision Technology
(Abstract)
J.L.C. Sanz
pp. 1-3
ABSTRACT
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PAPERS
An Automatic Wafer Inspection System Using Pipelined Image Processing Techniques
(Abstract)
H. Yoda
Y. Ohuchi
Y. Taniguchi
M. Ejiri
pp. 4-16
ABSTRACT
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Measuring Photolithographic Overlay Accuracy and Critical Dimensions by Correlating Binarized Laplacian of Gaussian Convolutions
(Abstract)
H.K. Nishihara
P.A. Crossley
pp. 17-30
ABSTRACT
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Automatic Solder Joint Inspection
(Abstract)
S.L. Bartlett
P.J. Besl
C.L. Cole
R. Jain
D. Mukherjee
K.D. Skifstad
pp. 31-43
ABSTRACT
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Structured Highlight Inspection of Specular Surfaces
(Abstract)
A.S. Sanderson
L.E. Weiss
S.K. Nayar
pp. 44-55
ABSTRACT
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A Rule Based Approach for Visual Pattern Inspection
(Abstract)
A.M. Darwish
A.K. Jain
pp. 56-68
ABSTRACT
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A System for PCB Automated Inspection Using Fluorescent Light
(Abstract)
Y. Hara
H. Doi
K. Karasaki
T. Iida
pp. 69-78
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Automated X-Ray Inspection of Aluminum Castings
(Abstract)
H. Boerner
H. Strecker
pp. 79-91
ABSTRACT
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Texture Measures for Carpet Wear Assessment
(Abstract)
L.H. Siew
R.M. Hodgson
E.J. Wood
pp. 92-105
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CORRESPONDENCE
A Monolithic Hough Transform Processor Based on Restructurable VLSI
(Abstract)
F.M. Rhodes
J.J. Dituri
G.H. Chapman
B.E. Emerson
A.M. Soares
J.I. Raffel
pp. 106-110
ABSTRACT
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A Pipelined Image Analysis System Using Custom Integrated Circuits
(Abstract)
E. Persoon
pp. 110-116
ABSTRACT
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A Line Extraction Method for Automated SEM Inspection of VLSI Resist
(Abstract)
D.B. Shu
C.C. Li
J.F. Mancuso
Y.N. Sun
pp. 117-120
ABSTRACT
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A Real-Time Processor for the Hough Transform
(Abstract)
K. Hanahara
T. Maruyama
T. Uchiyama
pp. 121-125
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