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IEEE Transactions on Pattern Analysis and Machine Intelligence
June 1986 (vol. 8 no. 6)
ISSN: 0162-8828
Table of Contents
Papers
Opinion (PDF)
pp. 677-678
John Canny, Artificial Intelligence Laboratory, Massachusetts Institute of Technology, Cambridge, MA 02139.
pp. 679-698
On Detecting Edges (Abstract)
Vishvjit S. Nalwa, Artificial Intelligence Laboratory and the Information Systems Laboratory, Stanford University, Stanford, CA 94305.
Thomas O. Binford, Artificial Intelligence Laboratory, Stanford University, Stanford, CA 94305.
pp. 699-714
Allen M. Waxman, Department of Electrical, Computer, and Systems Engineering, Boston University, Boston, MA 02215.
James H. Duncan, Flow Research Company, Silver Spring, MD 20910.
pp. 715-729
Thomas M. Strat, Artificial Intelligence Center, SRI International, Menlo Park, CA 94025.
Martin A. Fischler, Artificial Intelligence Center, SRI International, Menlo Park, CA 94025.
pp. 730-741
Anne-Marie Derouault, IBM France Scientific Center, 36 Avenue Raymond Poincaré, 75116 Paris, France.
Bernard Merialdo, IBM France Scientific Center, 36 Avenue Raymond Poincaré, 75116 Paris, France.
pp. 742-749
Kathleen M. Mutch, Department of Computer Science, Arizona State University. Tempe, AZ 85287.
pp. 750-755
Fernando A. Mota, Instituto de Pesquisas Espaciais, C. P. 515, 12200, S. J. Campos, SP, Brazil.
Flavio Roberto D. Velasco, Wang Institute of Graduate Studies, Tyngs-boro, MA 01879.
pp. 755-760
Frederick R. Krueger, Department of Operations Research, Stanford University, Stanford, CA 94305.
pp. 760-761
Baek S. Kim, Department of Medical Information Management, College of Medicine, Hanyang University, 17 Haengdangdong, Seong-dong-ku, Seoul 133, Korea.
Song B. Park, Department of Electrical Engineering, Korea Advanced Institute of Science and Technology, P.O. Box 150, Chongyangni, Seoul 131, Korea.
pp. 761-766
Index Edics (PDF)
pp. 767-772
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