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IEEE Transactions on Pattern Analysis and Machine Intelligence
January 1985 (vol. 7 no. 1)
ISSN: 0162-8828
Table of Contents
Papers
Ruth Shapira, Cognitive Information Processing Group, Research Laboratory of Electronics, Massachusetts Institute of Technology, Caambridge, MA 02139; Rafael, Armament Development Authority, Hai
pp. 1-16
W. Eric L. Grimson, Artificial Intelligence Laboratory, Massachusetts Institute of Technology, Cambridge, MA 02139.
pp. 17-34
J. Y. S. Luh, Department of Electrical and Computer Engineering, Clemson University, Clemson, SC 29631.
John A. Klaasen, IBM Corporation, Boca Raton, FL.
pp. 35-45
Yaser S. Abu-Mostafa, Division of Engineering and Applied Science, California Institute of Technology, Pasadena, CA 91125.
Demetri Psaltis, Division of Engineering and Applied Science, California Institute of Technology, Pasadena, CA 91125.
pp. 46-55
Renato De Mori, Department of Computer Science, Concordia University, Montreal, P. Q. H3G 1M8, Canada.
Pietro Laface, CENS-Dipartimento di Automaticae Informatica, Politecnico di Torino, 10129 Torino, Italy.
Yu Mong, Department of Computer Science, Concordia University, Montreal, P. Q. H3G 1M8, Canada; Department of Computer Science, Chinese University of Hong Kong, Hong Kong.
pp. 56-69
Pierpaolo Degano, Dipartimento di Informatica, Universita degli Studi di Pisa, Corso Italia, 40.I-56100 Pisa, Italy.
Franco Sirovich, Istituto di Elaborazione della Informazione, Pisa, Italy; Dipartimento di Informatica, Universita degli Studi di Torino, Via Valperga Caluso, 37.I-10125 Torino, Italy.
pp. 70-79
Lionel M. Ni, Department of Computer Science, Michigan State University, East Lansing, MI 48824.
Anil K. Jain, Department of Computer Science, Michigan State University, East Lansing, MI 48824.
pp. 80-89
Linda G. Shapiro, Machine Vision International, Ann Arbor, MI 48104.
Robert M. Haralick, Machine Vision International, Ann Arbor, MI 48104.
pp. 90-94
Hanan Samet, Department of Computer Science, University of Maryland, College Park, MD 20742.
pp. 94-98
G. Stephen Zabele, Department of Electrical and Computer Engineering, Clarkson University, Potsdam, NY 13676.
Jack Koplowitz, Department of Electrical and Computer Engineering, Clarkson University, Potsdam, NY 13676.
pp. 98-102
Bo Zhang, Department of Computer Engineering and Science, Tsinghua University, Beijing, People's Republic of China.
Ling Zhang, Department of Mathematics, Anqing Teachers' College, Anqing, Anhui, People's Republic of China.
pp. 103-107
Keinosuke Fukunaga, Department of Electrical Engineering, Purdue University, West Lafayette, IN 47907.
Thomas E. Flick, Department of Electrical Engineering, Purdue University, West Lafayette, IN 47907.
pp. 107-112
Ryuzo Takiyama, Department of Visual Communication Design, Kyushu Institute of Design, Minami-ku, Fukuoka 815, Japan.
pp. 112-116
Its'Hak Dinstein, Department of Electrical and Computer Engineering, Ben-Gurion University, Beersheva, Israel; IBM Research Laboratory, San Jose, CA 95193.
David W. L. Yen, IBM Research Laboratory, San Jose, CA 95193.
Myron D. Flickner, IBM Research Laboratory, San Jose, CA 95193.
pp. 116-121
W. E. L. Grimson, Artificial Intelligence Laboratory, Massachusetts Institute of Technology, Cambridge, MA 02139.
E. C. Hildreth, Artificial Intelligence Laboratory, Massachusetts Institute of Technology, Cambridge, MA 02139.
pp. 121-127
Author's Reply (Abstract)
R. M. Haralick, Machine Vision International, Ann Arbor, MI 48104.
pp. 127-129
Breaker Page (PDF)
pp. 131-132
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