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IEEE Transactions on Pattern Analysis and Machine Intelligence
June 1984 (vol. 6 no. 6)
ISSN: 0162-8828
Table of Contents
Papers
Alex P. Pentland, Artificial Intelligence Center, SRI International, Menlo Park, CA 94025.
pp. 661-674
Gerard Medioni, Intelligent Systems Group, Departments of Electrical Engineering and Computer Science, University of Southern, California, Los Angeles, CA 90089.
Ramakant Nevatia, Intelligent Systems Group, Departments of Electrical Engineering and Computer Science, University of Southern, California, Los Angeles, CA 90089.
pp. 675-685
Jean-Daniel Dessimoz, Department of Electrical Engineering, University of Rhode Island, Kingston, RI.; Ecole d'Ingenieurs de l'Etat de Vaud, Yverdon-les-Bains, Switzerland.
John R. Birk, Department of Electrical Engineering, University of Rhode Island, Kingston, RI.; Hewlett-Packard, Palo Alto, CA.
Robert B. Kelley, Department of Electrical Engineering, University of Rhode Island, Kingston, RI.
Henrique A. S. Martins, Department of Electrical Engineering, University of Rhode Island, Kingston, RI.; Instituto, Superior Tecnico, Lisbon, Portugal.
pp. 686-697
Yaser S. Abu-Mostafa, Division of Engineering and Applied Science, California Institute of Technology, Pasadena, CA 91125.
Demetri Psaltis, Division of Engineering and Applied Science, California Institute of Technology, Pasadena, CA 91125.
pp. 698-706
Haluk Derin, Department of Electrical and Computer Engineering, University of Massachusetts, Amherst, MA 01003.
Howard Elliott, Department of Electrical and Computer Engineering, University of Massachusetts, Amherst, MA 01003.
Roberto Cristi, Department of Electrical and Computer Enginerring, University of Massachusetts, Amherst, MA 01003.; Department of Electrical Engineering, University of Michigan, Dearborn, MI 48128
Donald Geman, Department of Mathematics and Statistics, University of Massachusetts, Amherst, MA 01003.
pp. 707-720
Stuart Geman, Division of Applied Mathematics, Brown University, Providence, RI 02912.
Donald Geman, Department of Mathematics and Statistics, University of Massachusetts, Amherst, MA 01003.
pp. 721-741
Stanley M. Dunn, Computer Vision Laboratory, Center for Automation Research, University of Maryland, College Park, MD 20742.
David Harwood, Computer Vision Laboratory, Center for Automation Research, University of Maryland, College Park, MD 20742.
Larry S. Davis, Computer Vision Laboratory, Center for Automation Research, University of Maryland, College Park, MD 20742.
pp. 742-747
Dilip M. Hardas, Department of Computer Science, State University of New York at Buffalo, Buffalo, NY 14260.; Tektronix Inc., Beaverton, OR 97077.
Sargur N. Srihari, Department of Computer Science, State University of New York at Buffalo, Buffalo, NY 14260.
pp. 748-757
Roland Wilson, Department of Electrical Engineering, Linköping University, Linköping, Sweden; Department of Electrical and Electronic Engineering, The University of Aston in Birmingham, Birmingha
Goesta H. Granlund, Department of Electrical Engineering, Linköping University, Linköping, Sweden.
pp. 758-767
Vipin Kumar, Department of Computer Sciences, University of Texas at Austin, Austin, TX 78712.
Laveen N. Kanal, Department of Computer Sciences, University of Maryland, College Park, MD 20742; L. N. K. Corporation, Silver Spring, MD.
pp. 768-778
Keinosuke Fukunaga, School of Electrical Engineering, Purdue University, West Lafayette, IN 47907.
Thomas E. Flick, School of Electrical Engineering, Purdue University, West Lafayette, IN 47907; Naval Research Laboratory, Washington, DC 20375.
pp. 779-788
Ruth Shapira, Cognitive Information Processing Group, Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, MA, 02139.; Rafael, Haifa, Israel.
pp. 789-794
J. M. Chassery, E.M.Q.C.-TIM 3, Cermo, 38402 Saint Martin, d'Heres Cedex, France.
C. Garbay, E.M.Q.C.-TIM 3, Cermo, 38402 Saint Martin, d'Heres Cedex, France.
pp. 794-800
R. L. Kashyap, School of Electrical Engineering, Purdue University, West Lafayette, IN 47907.
P. M. Lapsa, Department of Electrical Engineering, Virginia Polytechnic Institute and State University, Blacksburg, VA 24061.
pp. 800-809
R. H. Chesney, Mines and Range Clearance Group, Defense Research Establishment Suffield, Ralston AB, Canada, T0J 2N0.
Y. Das, Mines and Range Clearance Group, Defense Research Establishment Suffield, Ralston AB, Canada, T0J 2N0.
J. E. Mcfee, Mines and Range Clearance Group, Defense Research Establishment Suffield, Ralston AB, Canada, T0J 2N0.
M. R. Ito, Department of Electrical Engineering, University of British Columbia, Vancouver, B.C., Canada.
pp. 809-820
R. M. Inigo, School of Engineering and Applied Science, University of Virginia, Charlottesville, VA 22901.
E. S. Mcvey, School of Engineering and Applied Science, University of Virginia, Charlottesville, VA 22901.
B. J. Berger, School of Engineering and Applied Science, University of Virginia, Charlottesville, VA 22901.
M. J. Wirtz, School of Engineering and Applied Science, University of Virginia, Charlottesville, VA 22901.
pp. 820-826
Index Edics (PDF)
pp. 827-832
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